Hostname: page-component-7bb8b95d7b-nptnm Total loading time: 0 Render date: 2024-09-26T10:57:02.957Z Has data issue: false hasContentIssue false
  • English
  • Français

Small-Angle X-Ray Scattering of Carbon-Supported Metal Catalysts

Published online by Cambridge University Press:  28 February 2011

J Goodtsman ,
M. G. Phillips  and
H. Brumberger
J Goodtsman
Affiliation:
Syracuse University, Dept. of Chemistry, Syracuse, N.Y. 13244-1200
M. G. Phillips
Affiliation:
SUNY College at Cortland, Dept. of Chemistry, Cortland, N.Y. 13045
H. Brumberger
Affiliation:
Syracuse University, Dept. of Chemistry, Syracuse, N.Y. 13244-1200
Get access

Abstract

The slit-smeared intensity of X-radiation scattered from carbon-supported metal catalysts behaves as clh−1 + c2h−3 for higher h-values in the small-angle region (h+4πλ−1 sinθ, λ + X-ray wavelength,θ + half of scattering angle, c1, c2 are constants). For three-phase systems with sharp phase boundaries, uniform electron-densities in the metal and void phases, and lamellar electrondensity fluctuations in the carbon phase, the small-angle X-ray scattering (SAXS) can be described in terms of inter- and intraphase electron-density correlation functions, and can be shown to yield the observed behavior. Further assumptions are required to separate these contributions and calculate interfacial specific surfaces. SAXS measurements on Pt, Ru, Pd, and Rh/C are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 111: Symposium O – Microstructure and Properties of Catalysts , 1987 , 241
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Porod, G., Kolloid-Z. 124, 83 (1951).CrossRefGoogle Scholar
2. Debye, P., Anderson, H.R. Jr and Brumberger, H., J. Appl. Phys. 28, 679 (1957).CrossRefGoogle Scholar
3. Ciccariello, S., Goodisman, J. and Brumberger, H., J. Appl. Cryst., in press.Google Scholar
4. Perrett, R. and Ruland, W., J. Appl. Cryst. 1, 308 (1968).CrossRefGoogle Scholar
5. Ruland, W., J. Appl. Cryst. 4, 70 (1971).CrossRefGoogle Scholar
6. Jenkins, R. G., Walker, P.L. Jr, Linares-Solano, A., Rodriguez-Reinoso, F. and Salinas-Martinez de Leca, C., Carbon 20, 185 (1982).CrossRefGoogle Scholar
7. Goodisman, J. and Brumberger, H., J. Appl. Cryst. 4, 347 (1971).CrossRefGoogle Scholar
8. Kratky, O., Porod, G. and Skala, Z., Acta Phys. Austriaca 13, 76 (1960).Google Scholar
9. Kratky, O., in Small-Angle X-Ray Scattering, edited by H., Brumberger (Gordon and Breach, Science Publishers, New York, 1967).Google Scholar
10. Ergun, S. and Gifford, T.J., J. Appl. Cryst. 1, 313 (1968).CrossRefGoogle Scholar
11. Goodisman, J., Brumberger, H. and Cupelo, R., J. Appl. Cryst. 14, 305 (1981)CrossRefGoogle Scholar
12. Brumberger, H., Delaglio, F., Goodisman, J. and Whitfield, M., J. Appl. Cryst. 19, 287 (1986).CrossRefGoogle Scholar
13. Brumberger, H. and Goodisman, J., J. Appl. Cryst. 16, 83 (1983).CrossRefGoogle Scholar
14. Goodisman, J. and Coppa, N., Acta Cryst. A37, 170 (1981).CrossRefGoogle Scholar