Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-17T14:29:43.998Z Has data issue: false hasContentIssue false
  • English
  • Français

Science with EPICS, the E-ELT planet finder

Published online by Cambridge University Press:  10 November 2011

Raffaele Gratton ,
Markus Kasper ,
Christophe Vérinaud ,
Mariangela Bonavita  and
Hans M. Schmid
Raffaele Gratton
Affiliation:
INAF-Osservatorio Astronomico di Padova, Italy email: raffaele.gratton@oapd.inaf.it
Markus Kasper
Affiliation:
European Southern Observatory, Germany
Christophe Vérinaud
Affiliation:
Laboratoire de Astrophysique de Grenoble, France
Mariangela Bonavita
Affiliation:
INAF-Osservatorio Astronomico di Padova, Italy email: raffaele.gratton@oapd.inaf.it University of Toronto, Canada
Hans M. Schmid
Affiliation:
ETH Zurich, Switzerland
Rights & Permissions [Opens in a new window]

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

EPICS is the proposed planet finder for the European Extremely Large Telescope. EPICS is a high contrast imager based on a high performing extreme adaptive optics system, a diffraction suppression module, and two scientific instruments: an Integral Field Spectrograph (IFS) for the near infrared (0.95-1.65 μm), and a differential polarization imager (E-POL). Both these instruments should allow imaging and characterization of planets shining in reflected light, possibly down to Earth-size. A few high interesting science cases are presented.

Keywords

planetary systemsinstrumentation: adaptive optics
Type
Contributed Papers
Information
Proceedings of the International Astronomical Union , Volume 6 , Symposium S276: The Astrophysics of Planetary Systems: Formation, Structure, and Dynamical Evolution , October 2010 , pp. 343 - 348
Copyright
Copyright © International Astronomical Union 2011

References

Baraffe, I., Chabrier, G., & Barman, T. S. 2003, A&A, 402, 701Google Scholar
Beuzit, J.-L., Feldt, M., Doheln, K., et al. 2008, Proc. SPIE, 7014, 41Google Scholar
Cumming, A., Butler, R. P., Marcy, G. W., et al. 2008, PASP, 120, 531CrossRefGoogle Scholar
Fitzgerald, M. P., Kalas, P. G., Duchêne, G., et al. 2007, ApJ, 670, 536CrossRefGoogle Scholar
Green, J., Beichman, C., Basinger, S., et al. 2005, Proc. SPIE, 5905, 185Google Scholar
Marois, C., Macintosh, B., Soummer, R., et al. 2008, Proc. SPIE, 7015, 47Google Scholar
ODell, C. R. & Wen, Z. 1994, ApJ, 436, 194CrossRefGoogle Scholar