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Some Industrial Applications of Grazing Incident Exafs Techniques

Published online by Cambridge University Press:  21 February 2011

A. Stocks
Affiliation:
ICI Chemicals and Polymers Ltd., Runcorn, Cheshire, U.K.
D. J. Walbridge
Affiliation:
ICI Paints Division, Slough, U.K.
N. Falla
Affiliation:
The Paint Research Association, Middlesex, U.K.
S. Pizzini
Affiliation:
The University of Strathclyde, Department of Pure and Applied Chemistry, Glasgow, U.K.
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Abstract

An instrument to undertake grazing incident EXAFS has been developed. This is discussed along with some applications of its use on industrially important systems.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

1. Oldman, R. J., J. de Phys. C8 47, 321 (1986).Google Scholar
2. Barrett, N. T., Gibson, P. N., Greaves, G. N., Hackle, P., Roberts, K. J., Sacchi, M., XAFS V 5th International Conference on X-ray Absorption Fine Structure, Seattle WA. (1988).Google Scholar
3. Heald, S. M., J. de Phys. C8 47 825 (1986).Google Scholar
4. Barbee, T. W. Jr, Wong, J., XAFSV 5th International Conference on X-ray Absorption Fine Structure, Seattle WA (1988).Google Scholar
5. Parratt, L. G., Phys. Rev. 95, 359 (1954).CrossRefGoogle Scholar
6. Vineyeard, G. H., Phys. Rev. B 26, 4146 (1982).Google Scholar
7. Affrossman, S., Doyle, S., Lamble, G. M., Morris, M. A., Roberts, K. J., Sheen, D. B., Sherwood, J. N., Oldman, R. J., Hall, D., Davey, R. J., Greaves, G. N., J de Phys. C8 47, 167 (1986).Google Scholar
8. Heald, S. M., in Cemical Analysis V.92 X-ray Absorption, edited by Koningsberger, D. C. and Prins, R. (John Wiley & Sons, New York 1988) pp 87118.Google Scholar
9. Greaves, G. N., Harris, N., Moore, P., Oldman, R. J., Pantos, E., Pizzini, S., Roberts, K. J., 3rd International Conference on Synchrotron Radiation Instrumentation, Tsukuta Japan (1988).Google Scholar
10. Segmuller, A., Thin Solid Films 18, 287 (1973).Google Scholar
11. Fox, R., Gurman, S. J., J. Phys. C. 13, L249 (1980).Google Scholar
12. Gurman, S. J., Binstead, N., Ross, I., J. Phys. C. 17, 143 (1988).Google Scholar
13. Humphries, R. G., J. O. C. C. A. 1987 (6), 150.Google Scholar