Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-18T07:40:37.596Z Has data issue: false hasContentIssue false
  • English
  • Français

SEM/EDX Spectrum Imaging and Statistical Analysis of a Metal/Ceramic Braze

Published online by Cambridge University Press:  10 February 2011

Paul G. Kotula ,
Michael R. Keenan  and
Ian M. Anderson
Paul G. Kotula
Affiliation:
Sandia National Laboratories, PO Box 5800, Albuquerque, NM 87185-1405
Michael R. Keenan
Affiliation:
Sandia National Laboratories, PO Box 5800, Albuquerque, NM 87185-1405
Ian M. Anderson
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6376
Get access

Abstract

Energy dispersive x-ray (EDX) spectrum imaging has been performed in a scanning electron microscope (SEM) on a metal/ceramic braze to characterize the elemental distribution near the interface. Statistical methods were utilized to extract the relevant information (i.e., chemical phases and their distributions) from the spectrum image data set in a robust and unbiased way. The raw spectrum image was over 15 Mbytes (7500 spectra) while the statistical analysis resulted in five spectra and five images which describe the phases resolved above the noise level and their distribution in the microstructure

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 329
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Newbury, D. E. and Bright, D. S., Microscopy and Microanalysis 5 (1999) 333.Google Scholar
2.Trebbia, P. and Bonnet, N., Ultramicroscopy 34 (1990) 165.Google Scholar
3.Anderson, I. M. and Bentley, J., Proc. Microscopy & Microanalysis 1997, 931.Google Scholar
4.Anderson, I. M. and Bentley, J., Mater. Res. Soc. Symp. Proc. 458 (1997) 81.Google Scholar
5.Anderson, I. M., Proc. 14th ICEM: Electron Microscopy 1998 1 (1998) 357.Google Scholar