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Relaxor Pb(Mgl/3Nb2/3)O3 Thin Films: Processing, Dielectric and Electrostrictive Properties

Published online by Cambridge University Press:  10 February 2011

Z. Kighelman ,
D. Damjanovic ,
A. Seifert ,
S. Gentil ,
S. Hiboux  and
N. Setter
Z. Kighelman
Affiliation:
Ceramics Laboratory, Materials Department, EPFL Swiss Federal Institute of Technology, CH- 1015 Lausanne, Switzerland
D. Damjanovic
Affiliation:
Ceramics Laboratory, Materials Department, EPFL Swiss Federal Institute of Technology, CH- 1015 Lausanne, Switzerland
A. Seifert
Affiliation:
Ceramics Laboratory, Materials Department, EPFL Swiss Federal Institute of Technology, CH- 1015 Lausanne, Switzerland
S. Gentil
Affiliation:
Ceramics Laboratory, Materials Department, EPFL Swiss Federal Institute of Technology, CH- 1015 Lausanne, Switzerland
S. Hiboux
Affiliation:
Ceramics Laboratory, Materials Department, EPFL Swiss Federal Institute of Technology, CH- 1015 Lausanne, Switzerland
N. Setter
Affiliation:
Ceramics Laboratory, Materials Department, EPFL Swiss Federal Institute of Technology, CH- 1015 Lausanne, Switzerland
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Abstract

Lead magnesium niobate, Pb(Mg1/3Nb2/3)O3, thin films were formed from alkoxide-based solution precursors. To obtain stable and reproducible PMN precursor solution, a special effort has been undertaken to optimize the precursor synthesis. The organic decomposition behavior and crystalline phase development in a dried gel powder are reported. The influence of different seeding layers on the microstructures is shown. Dielectric and electromechanical measurements were carried out. Films show relaxor-like behavior, but with dielectric permittivity which is low (4500 at peak) compared to bulk ceramics and single crystals. Several parameters which might be responsible for this lower permittivity are suggested. Large electric dc bias fields (up to 120 kV/cm) can be applied to the films. This dc field reduces the permittivity, suppresses the frequency dispersion and flattens the permittivity peak. The anomaly associated with the field induced transition into a ferroelectric phase was not observed. Electrostrictive strains versus amplitude of electric field were measured and are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 596: Symposium Y – Ferroelectric Thin Films VIII , 1999 , 523
Copyright
Copyright © Materials Research Society 2000

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