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Process Development and Reliability Study Of Gfpdni Finish For Sc Packaging

Published online by Cambridge University Press:  10 February 2011

I. Boguslavsky
Affiliation:
Bell Laboratories, Lucent Technologies, 600 Mountain Ave., Murray Hill, NJ 07974
J. A. Abys
Affiliation:
Bell Laboratories, Lucent Technologies, 600 Mountain Ave., Murray Hill, NJ 07974
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Abstract

GFPdNi was tested for Frame-Lid Assemblies (FLAs) utilized in the sealing SC packages. Plating conditions were adjusted to enhance corrosion resistance with concurrent control over hydrogen content and thickness distribution of the deposit. GFPdNi-plated lids exhibit excellent corrosion resistance, most notably when compared standard Au-plated and GFPdNi-plated lids after a heat-treatment used to simulate sealing process (Fig. 1). This is most likely due to PdNi layer being known as a good interdiffusion barrier.

The reliability of lidded packages was tested by standard methods. It has been revealed that the thickness of the PdNi layer affects the yield in thermal cycling and thermal shock experiments. Auger studies implemented for failure analysis showed the correlation between intermetallic diffusion during the sealing process (due to insufficient thickness of PdNi deposit) and the reliability of the solder joint. A successful field evaluation trial has proven the capability of this new plating process.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

1 Boguslavsky, I., Abys, J.A., et. Plat and urf. Fin., 83, 72 (1996)Google Scholar
2 Kudrak, II. E. J., Abys, J. A.. Interconnection technology, June 1993, p.18 Google Scholar
3 AES Symposium on Substitution for Gold, 1980, Milwoukee, WI Google Scholar
4 AES Symposium on Electronic Use of and Substitution for Precious Metals in Electronic Industry, 1982, Ma.Google Scholar
5 Antler, M.. Platinum Metal Review, 1987, vol. 31, No 1, pp. 1319.Google Scholar
6 Kudrak, E. J., Abys, J. A., Chinchankar, V., Maisino, J. J., Plat, and Surf. Fin., 79, 49 (February, 1992).Google Scholar
7 Chao, J. L., Gore, R. R., Proc. AESF SUR/FIN'91, 537 (1991).Google Scholar
8 Abys, J A., Straschil, H. K., Kadija, I., Kudrak, E. J., Blee, I.. Trans, of the Institute of Metal Finishing, July 1991, p. 43.Google Scholar
9 Kadija, I V., Abys, J A., Kudrak, E. J., Maisano, J. J.. Proc. International Conference of AESF Society, June 22–25, 1992, vol. 1, p. 285.Google Scholar
10 Kadija, I. V., etc. Plating and Surface Finishing, 82, 56 (1995)Google Scholar
11 Korbelak, A., Duva, R.. Proc. Amer. Electroplaters Soc, 48, 142 (1961)Google Scholar
12 Schuessler, P., Feliciano-Welpe, D.. Hybrid Circuit Technol., (Jan. 1991)Google Scholar