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Numerical 3D-Simulation of Micromorph Silicon Thin Film Solar Cells

  • Stefan Geißendörfer (a1), Karsten von Maydell (a1) and Carsten Agert (a1)

Abstract

In this contribution 1, 2 and 3-dimensional simulations of micromorph silicon solar cells are presented. In order to simulate solar cells with rough interfaces, the surface topographies were measured via atomic force microscopy (AFM) and transferred into the commercial software Sentaurus TCAD (Synopsys). The model of the structure includes layer thicknesses and optoelectronic parameters like complex refractive index and defect structure. Results of the space resolved optical generation rates by using of the optical solver Raytracer are presented. The space resolved optical generation rate inside the semiconductor layers depends on the structure of the transparent conductive oxides (TCO) interface. In this contribution the influence of different optical generation rates on the electrical characteristics of the solar cell device are investigated. Furthermore, the optical and electrical results of the 1D, 2D and 3D structures, which have equal layer thicknesses and optoelectronic parameters, are compared.

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1. Čampa, A., Isabella, O., van Erven, R., Peeters, P., Borg, H., Krč, J., Topič, M. and Zeman, M., Progress in Photovoltaics: Research and Applications 18, 160167 (2010).10.1002/pip.940
2. Pflaum, C. et al. ., in Proceedings of the 24th European Photovoltaic Solar Energy Conference, 2310-2312, Hamburg (2009).
3. Lacombe, J. et al. ., in Proceedings of the 35th IEEE Photovoltaic Specialist Conference, 15351539, Hawaii (2010).
4. Geißendörfer, S. et al. ., in Proceedings of the 25th European Photovoltaic Solar Energy Conference, 3133, Valencia (2010).
5. Kilper, T. et al. ., in Proceedings of the 20th European Photovoltaic Solar Energy Conference, 1544-1547, Barcelona (2005).
6. Rech, B., PhD. Thesis, Forschungszentrum Jülich, Jül-3427, 1997.
7. Willemen, J.A., PhD. Thesis, Delft University of Technology, 1998.
8. Sturiale, A., Li, Hongbo T., Rath, J. K., Schropp, R. E. I., and Rubinelli, F. A., J. Appl. Phys. 106, 14502 (2009).10.1063/1.3151691

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