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Ion-Assisted Pulsed Laser Deposition of BN Films
Published online by Cambridge University Press: 21 February 2011
Abstract
Boron nitride films grown by ion-assisted pulsed laser deposition have been characterized by infrared absorption, auger electron pectroscopy, and transmission electron microscopy. Elemental bonding and the crystallinity of BN films grown in three nitrogen ion energy regimes:high (2500 eV), low (700 eV), and without ions (0 eV) are examined, and the results interpreted within the framework of a compressive stress mechanism for cBN film growth.
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- Copyright © Materials Research Society 1995
References
1
Terminello, L. J., Chaiken, A., Lapiano, D. A.-Smith, Doll, G. L., and Sato, T., J. Vac. Sci. Technol. A 12, 2462 (1994).Google Scholar
2
Edgar, J. H. (ed.), Properties of Group III Nitrides, EMIS Datareview Series No. 11, (INSPEC, London, UK, 1994).Google Scholar
3
Pouch, J. J. and Alterovitz, S. A. (eds.), Synthesis and Properties of Boron Nitride, (Trans Tech, Brookfield, Vermont, 1990).Google Scholar
4
Ballal, A. K., L. Salamanca-Riba, Doll, G. L., Taylor, C. A. II, and Clarke, R., J. Mater. Res.
7, 1618 (1992).Google Scholar
5
Ballal, A. K., Salamanca, L.-Riba, Taylor, C. A. II, and Doll, G. L., Thin Solid Films
224, 46 (1993).Google Scholar
6
Doll, G. L., Militello, M. C., Simko, S. J., Ballal, A. K., and Salamanca-Riba, L., in Silicon Carbide and Related Materials, edited by Spencer, M. G., Devaty, R. P., Edmond, J. A., Asif Khan, M., kaplan, R., and Rahman, (Institute of Physics Conference Series Number 137, Bristol, UK, 1994) pp. 449–452.Google Scholar
9
Trehan, R., Lifshitz, Y., and Rabalais, J. W., J. Vac. Sci. Technol. A 8, 4026 (1990).Google Scholar
11
Chaiken, A., Terminello, L. J., Wong, J., Doll, G. L., and Taylor, C. A.
II, appl. Phys. Lett.
63, 2112 (1993).Google Scholar
12
McKenzie, D. R., McFall, W. D., Sainty, W. G., Davis, C. A., and Collins, R. E., Di A. Rel. Mater.
2, 970 (1993).Google Scholar
14
Davis, R. F., Ailey, K. S., Kern, R. S., Kester, D. J., Sitar, Z., Smith, L., Tanaka, S., and Wang, C. in Diamond. SiC and Nitride Wide Bandgap Semiconductors, edited by Carter, C. H. Jr., Gildenblat, G., Nakamura, S., and Nemanich, R. J. (Mater. Res. Soc. Proc. 339, Pittsburgh, PA, 1994) pp. 351–362.Google Scholar
15
Friedman, T. A., Clift, W. M., Johnsen, H. A., Klaus, E. J., McCarty, K. F., Medlin, D. L., Mills, M. J., and Ottesen, D. K., in Laser ablation in Materials Processing: Fundamentals and applications, edited by Braren, B., Dubowski, J. J., and Norton, D. P. (Mater. Res. Soc. Proc. 285, Pittsburgh, PA, 1993) pp. 507–512.Google Scholar
16
Johansson, M., Hultman, L., Luthje, H., Bewilogua, K., Daaud, S., Willich, P., and Jager, S., presented at the 1994 intl. Conf. on Met. Coatings and Thin Films, San Diego, CA, 1994 (unpublished).Google Scholar