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Influence of Interface Roughness Scattering on Electron Mobility in GaAs-Al0.3Ga0.7 as Two Dimensional Electron Gas (2DEG) Heterostructures

  • Bin Yang (a1), Yong-Hai Cheng (a1), Zhan-Guo Wang (a1), Ji-Ben Liang (a1), Qi-Wei Liao (a1), Lan-Ying Lin (a1), Zhan-Ping Zhu (a1), Bo Xu (a1) and Wei Li (a1)...


We have studied the influence of interface roughness scattering on the mobility of two-dimensional electron gas(2DEG) in GaAs-AlGaAs modulation-doped heterostructures(MDH) both experimentally and theoretically. When the background ionized impurity concentration in the GaAs layer is smaller than 2.5×1015cm-3, our investigation shows that interface roughness scattering is the dominant scattering mechanism in the high 2DEG density(Nş ≥5× 1011cm2) GaAs-AlGaAs MDH. We also demonstrate that interface roughness scattering is about an order of magnitude stronger than alloy disorder scattering in GaAs-AlGaAs MDH if the AlGaAs/GaAs interface fluctuation is only one monolayer of GaAs.



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[1]. Ando, T., Fowler, A.B. and Stern, F., Rev. Mod. Phys. 54, 437 (1982)
[2]. Sakaki, H., Noda, T., Hirakawa, K., Tanaka, M., and Matsusue, T., Appl. Phys. Lett. 51, 1934 (1987)
[3]. Gottinger, R., Gold, A., Abstreiter, A., Weimann, G., and Schlapp, W., Europhys. Lett 6, 183 (1988)
[4]. Ando, T., J. of the Phys. Soci, of Jpn. 51, 3900 (1982)
[5]. Walukiewicz, W., Ruda, H.E., Lagowski, J., and Gatos, H.C., Phys. Rev. B 30, 4571 (1987)
[6]. Hiyamizu, S., Saito, J., Nanbu, K., and Ishikawa, T., Jpn. J. of Appl. Phys. 22, L609 (1983)
[7]. Yang, Bin, Cheng, Yong-hai, Wang, Zhan-guo, Liang, Ji-Ben, Liao, Qi-wei, Lin, Lan-ying, “Study on the Scattering Mechanisms of GaAs/AlGaAs 2DEG Heterostructure” Chinese Journal of Semiconductors, to be published(accepted).
[8]. Ando, T., J. of the Phys. Soci, of Jpn. 51, 3893 (1982)
[9]. Stormer, H.L., Gossard, A.C., Wiegmann, W., Solid State Communication 41, 707 (1982)
[10]. Singh, J., Bajajaj, K.K., J. Appl. Phys. 57(12), 5433 (1985)
[11]. Bimberg, D., Christen, J., Fukunaga, T., Nakashima, H., Mars, D.E. and Miller, J.N., J. Vac. Sci. Technol. B5(4), 1192 (1987)
[12]. Liang, Ji-ben, Wang, Zhan-guo, Kong, Mei-ying, Zhu, Zhan-ping, Yang, Bin, Xu, Bo, Li, Wei, Kuang, Guo-kui, Proceeding of The Fourth Chinese National Conference on Thin Solid Films, 171 (1994)
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  • ISSN: -
  • EISSN: 1946-4274
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