Skip to main content Accessibility help
×
Home

Correlation between microstructure, DC resistivity and magnetoresistance of SrRuO3 films.

  • K. Khamchane (a1), R. Gunnarsson (a1), Z.G. Ivanov (a1), A. Vorobiev (a2) (a3), P. Rundqvist′ (a2) and S. Gevorgian (a2) (a4)...

Abstract

We have investigated the correlation between microstructure, DC resistivity and magnetoresistance of SrRuO3 thin films. The films were epitaxially grown by pulsed laser deposition on (001) SrTiO3 substrates in a temperature range of 690–810°C. According to x-ray measurements, the structure of all films is a mixture of highly oriented domains of strained orthorhombic phases (ortho-I and ortho-II) with different lattice parameters. Films deposited at 780°C show a minimum resistivity (270 μΩcm at 300 K) and a maximum magnetoresistance (8% at 5 K). These films consist mainly of ortho-I phase (a=0.393 nm). Films deposited at 690°C (predominantly ortho-II) have the highest resistivity (up to 1700 μΩcm at 300 K) and lowest magnetoresistance (3% at 5K).

Copyright

References

Hide All
1. Bensch, W., Schmalle, H. W., and Reller, A.. Solid State Jonics, Diffusion & Reactions, 43: 171, 1990
2. Jiang, J. C., Pan, X. Q., and Chen, C. L.. Applied Physics Letter, 72(8): 909, 1998.
3. Zakharov, N. D., Satyalakshmi, K. M., Koren, G., and Hesse, D.. Journal of Materials Research, 14(11): 4385, 1999.
4. Klein, L., Dodge, J.S., Ahn, C. H., Reiner, J. W., Mieville, L., Geballe, T. H., Beasley, M. R., and Kapitulnik, A.. Journal of Physics Condensed Matter, 8(48): 10111, 1996.
5. Gausepohl, C., Lee, M., Char, K., Rao, R. A., and Eom, C. B.. Physical Review B, 52(5): 3459, 1995.
6. Gan, Q., Rao, R. A., Eom, C. B., Garrett, J. L., and Lee, M.. Applied Physics Letter, 72(8): 978, 1998.
7. Gupta, A., Hussey, B. W., and Shaw, T. M.. Materials Research Bulletin, 31(12): 1463, 1996.
8. Eom, C. B, Cava, R. J., Fleming, R. M., Philips, J. M., van Dover, R. B., Marshall, J. H., Hsu, J. W. P., Krajewski, J. J, and Peck, W. F. Jr. Science, 258(5098): 1766, 1992.
9. Iliev, M., Thomsen, C., Hadjiev, V., and Cardona, M.. Physical Review B, 47(18): 12341, 1993.
10. Cao, G., McCall, S., Shepard, M., Crow, I.E., and Guertin, R. P.. Physical Review B, 56(1): 321, 1997.

Correlation between microstructure, DC resistivity and magnetoresistance of SrRuO3 films.

  • K. Khamchane (a1), R. Gunnarsson (a1), Z.G. Ivanov (a1), A. Vorobiev (a2) (a3), P. Rundqvist′ (a2) and S. Gevorgian (a2) (a4)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed