No CrossRef data available.
Article contents
Complex Defects in Semiconductors
Published online by Cambridge University Press: 25 February 2011
Abstract
Complex defects in semiconductors are briefly reviewed, with emphasis on the electronic structure. Classes of such defects with a varying degree of complexity are discussed, with reference to recent optical data for neutral defects in GaP and silicon. These include PGa-antisite related substitutional complexes in GaP, Gai-acceptor complexes in GaP, substitu-tional chalcogen complex defects in silicon and vacancy-impurity complexes in silicon.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1990
References
1 For an update on the present status of research on shallow impurities see e.g. Proc. 3rd Intl. Conf. on Shallow Impurities in Semiconductors, Linköping, Sweden, Aug. 1988, Inst. Phys. Conf. Ser. 95, 1988, ed. B. Monemar.Google Scholar
2 For a recent review on deep levels see e.g. Pantelides, S.T., Deep Centers in Semiconductors (Gordon and Breach, New York, 1986).Google Scholar
3
Monemar, B., CRC Critical Reviews on Solid State and Materials Sciences
15, 111 (1988).Google Scholar
5
Car, R., Kelly, P., Oshiyama, A., and Pantelides, S.T., Phys. Rev. Lett.
52, 1814 (1984).Google Scholar
6
Dabrowski, J. and Schemer, M., Phys. Rev. Lett.
60, 2183 (1988); D.J. Chadi and K.J. Chang, Phys. Rev. Lett. 60, 2187 (1988).Google Scholar
9
Chen, W.M., Monemar, B., and Godlewski, M., Defect and Diffusion Forum, 62/63, 133 (1989).Google Scholar
10
Khachaturyan, K., Kaminska, M., Weber, E.R., Becla, P., and Street, R.A., Phys. Rev.
B40, 6304 (1989)Google Scholar
11
Dean, P.J., “Luminescence of Crystals, Molecules and Solutions”, ed Williams, F., (Plenum, New York, 1973) p. 538.Google Scholar
12
Watkins, G.D. and Corbett, J.W., Phys. Rev.
121, 1001 (1961); J.W. Corbett, G.D. Watkins, R.M. Crenko, and R.S. McDonald, Phys. Rev. 121, 1015 (1961).Google Scholar
16
Morgan, T.N., Welber, B., and Bhargava, R.N., Phys. Rev.
166, 751 (1968); C.H. Henry, P.J.Dean, and J.D. Cuthbert, ibid., 166, 754 (1968).Google Scholar
17
Ludwig, G.W. and Woodbury, H.H., Solid State Physics, Vol. 3 (Academic Press, New York, 1962) p. 223.Google Scholar
18
Sauer, R. in Microscopic Identification of Electronic Defects in Semiconductors, edited by Johnson, N.M., Bishop, S.G., and Watkins, G.D. (Materials Research Society Proc. 46, Pittsburgh, PA
1987) p. 507.Google Scholar
20
Watkins, G.D., Proc. 15th Int. Conf. on Defects in Semiconductors, Budapest, Aug. 22–26, 1986, Ferenczi, G., ed., Materials Science Forum
38/41, p. 39
Google Scholar
21
Watkins, G.D., Proc. 14th Int. Conf. on Defects in Semiconductors, Paris, Aug. 18–22, 1986, von Bardeleben, H., ed., Materials Science Forum
10/11, p. 953
Google Scholar
26
Godlewski, M., Chen, W.M., and Monemar, B., Defect and Diffusion Forum, 62/63, 107 (1989).Google Scholar
36
Janzèn, E., Stedman, R., Grossmann, G., and Grimmeiss, H.G., Phys. Rev.
B29, 1907 (1984).Google Scholar
37
Sankey, O.F. and Dow, J.D., Phys. Rev.
B26, 3243 (1982); G. Kim, J.D. Dow, and S. Lee, Phys. Rev. 1340, 7888 (1989).Google Scholar
39
Singh, M., Lightowlers, E. C., and Davies, G., Proc. E-MRS 1989 Spring Meeting, May 30-June 2, Strasbourg, France, (in press).Google Scholar
41
Chen, W.M., Henry, A., Janzèn, E., Monemar, B., and Thewalt, M.L.W., (these proceedings).Google Scholar
48
Chen, W.M., Awadelkarim, O.O., Monemar, B., Lindström, J.L., and Oehrlein, G.S., (unpublished).Google Scholar