Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-17T17:21:01.689Z Has data issue: false hasContentIssue false

Comparison of the Subband Transitions in Asymmetric and Symmetric GaAs/InxGa1-xAs/AlyGa1-yas Quantum Wells

Published online by Cambridge University Press:  21 February 2011

K. Pieger
Affiliation:
Technische Physik, University of Würzburg, Am Hubland, 97074 Würzburg, Germany
J. Straka
Affiliation:
Technische Physik, University of Würzburg, Am Hubland, 97074 Würzburg, Germany
A. Forchel
Affiliation:
Technische Physik, University of Würzburg, Am Hubland, 97074 Würzburg, Germany
V. Kulakovskii
Affiliation:
Inst. of Solid State Physics, Russian Academy of Science, 142432 Chernogolovka, Russia
T.L. Reinecke
Affiliation:
Naval Research Laboratory, Electronic Materials Branch, Washington, DC 20375, USA
Get access

Abstract

Shallow symmetric and asymmetric GaAs/InGaAs/(Al)GaAs single quantum wells with an indium content of 5% and less, grown by MBE, show striking differences in their photoluminescence spectra. Unlike the symmetric case, the asymmetric quantum wells are found to have no bound ground state below a certain thickness, which depends on the indium content of the quantum well and the aluminium content of the barrier. For a set of asymmetric samples investigated here, the bound state vanishes at about 60Å.

Photoluminescence excitation measurements on shallow symmetric and asymmetric wells show a series of narrow lines with oscillator strengths many times exceeding those of the band to band transition. These lines can be identified with excited excitonic transitions including heavy and light holes.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Reithmaier, J.P., Cerva, H., Lösch, R., Appl. Phys. Lett. 54, 48 (1989)Google Scholar
2 Nickel, H., Lösch, R., Schlapp, W., Leier, H., Forchel, A., Surface Science 228, 340343 (1990)Google Scholar
3 Landau, L. D., Lifshitz, E. M., Course of Theoretical Physics. Ill, 2nd ed. (Pergamon Press Ltd., London, 1959) p. 63 Google Scholar
4 Plana, R., Escotte, L., Llopis, O., Amine, H., Parra, T., Gayral, M., J. Graffeuil, IEEE ED-40, 852 (1993)Google Scholar
5 Moison, J. M., Elcess, K., Houzay, F., Marzin, J. Y., Gérard, J. M., Barthe, F., Bensoussan, M., Phys. Rev. B 41, 12945 (1990)Google Scholar
6 Dreybrodt, J., Forchel, A., Reithmaier, J.P., Phys. Rev. B 48, 14741 (1993)Google Scholar
7 Dandrea, A., Thomassini, N., Phys. Rev. B 47, 7176 (1993)Google Scholar