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Characterization of Laser Ablated Germanium Nanoclusters

Published online by Cambridge University Press:  09 August 2011

S. Vijayalakshmi ,
F. Shen ,
Y. Zhang ,
M. A. George  and
H. Grebel
S. Vijayalakshmi
Affiliation:
vijaya@megahertz.njit.edu
F. Shen
Affiliation:
Nonlinear Nanostructures Laboratory, Electrical and Computer Engineering New Jersey Institute of Technology, Newark, N J-071 02
Y. Zhang
Affiliation:
Nonlinear Nanostructures Laboratory, Electrical and Computer Engineering New Jersey Institute of Technology, Newark, N J-071 02
M. A. George
Affiliation:
University of Alabama at Huntsville, Huntsville, AL-35899
H. Grebel
Affiliation:
Nonlinear Nanostructures Laboratory, Electrical and Computer Engineering New Jersey Institute of Technology, Newark, N J-071 02
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Abstract

Morphological characterization and the nonlinear optical properties of laser ablated germanium nanoclusters are discussed in this paper. Laser ablated films contain micron sized droplets that are composed of nanoclusters. The clusters have cubic and tetragonal symmetry. Results from TEM, AFM, and XRD are presented for the surface characterization. Nonlinear absorption is observed at very low light intensities and nonlinear absorption and refraction are seen at peak light intensities of 18 KW/cm2 at λ. = 532 nm. The estimated change in refractive index is 0.05 at these intensity levels.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 536: Symposium F – Microcrystalline & Nanocrystalline Semiconductors - 1998 , 1998 , 527
Copyright
Copyright © Materials Research Society 1999

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References

[1] Singh, R. K., Bhattacharya, D., and Narayan, J., Appl. Phys. Lett. 61, 483 (1992)Google Scholar
[2] Kennedy, R. J., Thin Solid Films 214, 223 (1994)Google Scholar
[3] Camata, R., Atwater, H. A., Vahala, K. J., and Flagan, R. C., Appl. Phys. Lett. 68, 3162 (1996)Google Scholar
[4] Yoshida, T., Takeyama, S., Yamada, Y., and Mutoh, K. Appl. Phys. Lett. 68, 1772 (1996)Google Scholar
[5] Vijayalakshmi, S., Iqbal, Z., George, M. A., Federici, J., and Grebel, H., To appear in Thin Solid FilmsGoogle Scholar
[6] Vijayalakshmi, S., Grebel, H., Iqbal, Z., and White, C. W., J. Appl. Phys. to appear in Dec. 15, 1998 issue.Google Scholar
[7] Antoni, F., Fuchs, C., and Fogarassy, E., Appl. Surf. Sci. 96–98 50 (1996)Google Scholar
[8] Sato, S., Nozaki, S., and Morisaki, H., Appl. Phys. Lett. 72 2460 (1998)Google Scholar
[9] Jiang, J., Chen, K., Huang, X., Li, Z., and Feng, D. Appl. Phys. Lett. 65 1799 (1994)Google Scholar
[10] Gonzalez-Hernandez, J., Azerbayejani, G. H., Tsu, R., and Pollak, F. H., Appl. Phys. Lett. 47, 1350 (1985)Google Scholar
[11] Tognini, P., Andreani, L. C., Geddo, M., Stella, A., Cheyssac, P., Kofman, R., and Migliori, A., Phys. Rev. B 53, 6992 (1996)Google Scholar