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The Berkeley Atomic Resolution Microscope – an Update

Published online by Cambridge University Press:  21 February 2011

C. J. D. Hetherington
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, 1 Cyclotron Rd., Berkeley, CA 94720.
E. C. Nelson
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, 1 Cyclotron Rd., Berkeley, CA 94720.
K. H. Westmacott
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, 1 Cyclotron Rd., Berkeley, CA 94720.
R. Gronsky
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, 1 Cyclotron Rd., Berkeley, CA 94720.
G. Thomas
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, 1 Cyclotron Rd., Berkeley, CA 94720.
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Abstract

Recent modifications to the JEOL ARM-1000 microscope have markedly enhanced its performance. The point resolution limit at 1000kV is confirmed by optical diffractograms down to 1.7Å and there are firm indications of contrast transfer down to 1.4Å. The unique tilting capability of the ARM, ±40° biaxial tilt over the 800kV to 1000kV range, is preserved at this resolution. This paper presents the measured imaging parameters and results of resolution tests.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Gronsky, R., “38th Ann. Proc Electron Microscopy Soc. Amer.” p2, (San Francisco, California), Bailey, G.W. (ed.) 1980.Google Scholar
2. Watanabe, H. et al., “Proc. of 7th Int. Conf. on High Voltage Electron Microscopy”, p5, (Lawrence Berkeley Laboratory, California) Fisher, R.M., Gronsky, R. and Westmacott, K.H. (eds.) 1983.Google Scholar
3. Smith, D.J. et al., Ultramicroscopy, 11, (1983) pp263282.Google Scholar
4. the beam tilt wobbler was built and installed by A. Higgs of Academ Co., 2136 E. Cornell, Tempe, AZ 85283Google Scholar
5. Tsuno, K. and Honda, T., Optik, 64 p367 (1983)Google Scholar
6. Iijima, S. and O'Keefe, M.A., J. of Microscopy 117 p347 (1979)CrossRefGoogle Scholar
7. O'Keefe, M.A.in report by Fisher, R.M. and Imura, I., Ultramicroscopy 3 (1978) p3.Google Scholar
8. Smith, D.J. et al. J. Microscopy, 130 pp127136 (1983)CrossRefGoogle Scholar
9. Hull, R. et al., Appl. Phys. Lett 49 p1714 (1986)Google Scholar
10. Ponce, F.A. and Hetherington, C.J.D., to be published.Google Scholar