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Atom Probe Studies of Interfaces in Metallic Multilayers

Published online by Cambridge University Press:  26 July 2012

Alfred Cerezo ,
Jonathon M. Hyde ,
Mark G. Hetherington  and
Amanda K. Petford-Long
Alfred Cerezo
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OXI 3PH, U.K.
Jonathon M. Hyde
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OXI 3PH, U.K.
Mark G. Hetherington
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OXI 3PH, U.K.
Amanda K. Petford-Long
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OXI 3PH, U.K.
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Abstract

The atom probe field-ion microscope has been used to study the diffusion at interfaces in metallic multilayers deposited directly onto field-ion specimens and to develop models for the solid state reactions occuring at the atomic-scale in multilayer systems. Results are presented for the low temperature annealing of a Co-Ni multilayer. Intermixing over about 2 atomic planes is found even in as-deposited samples, extending to mnm after heating at 300°C for 1 hour. Using atom probe results from bulk alloys, a Monte Carlo simulation has been developed for the Fe-Cr system, in which a miscibility gap exists, and is being used in an attempt to model the behaviour of interfaces in Fe-Cr multilayers. Preliminary results are presented, showing that interfaces which are initially mixed over 10 atomic planes become sharper by an ‘interface spinodal’ reaction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 230: Symposium R – Phase Transformation Kinetics in Thin Films , 1991 , 79
Copyright
Copyright © Materials Research Society 1992

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