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AFM Imaging of the Crystalline-To-Amorphous Transition On the Surface of Ion-Implanted Mica

Published online by Cambridge University Press:  15 February 2011

Ray K. Eby ,
Grant S. Henderson ,
Fred J. Wicks  and
George W. Arnold
Ray K. Eby
Affiliation:
Dept of Geology, Univ of Toronto, 22 Russell St, Toronto, Ontario, Canada M5S 3B1
Grant S. Henderson
Affiliation:
Dept of Geology, Univ of Toronto, 22 Russell St, Toronto, Ontario, Canada M5S 3B1
Fred J. Wicks
Affiliation:
Mineralogy Dept, Royal Ontario Museum, 100 Queens Park, Toronto, Ont M5S 2C6
George W. Arnold
Affiliation:
Dept 1111, Sandia National Laboratories, Albuquerque, New Mexico, USA 87185
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Abstract

Scanning microscopy is the only technique available for directly imaging the short-range structural features of the crystalline-to-amorphous (C-A) transition. Cleaved sheets of muscovite were implanted with 600 keV argon ions in order to induce radiation damage; thus producing the C-A transition. AFM images of Ar-implanted muscovite show the surface structural features of the C-A transition. Low-resolution images show a progressive increase in the surface roughness of muscovite with increasing ion dose, as seen by the development of hummocky microtopography, whose individual hummocks are 25 nm across. High-resolution AFM images of unimplanted muscovite reveal a highly crystalline structure, as shown by the hexagonal arrangement of the (SiO4)-tetrahedral layers. By scraping through the uppermost surface layer of the implanted samples, using a cantilever forces of 50 - 100 nN, the C-A transition is recognized by a decrease in the long-range order of the tetrahedral layers. Accordingly, crystal defects and highly disordered regions increase in frequency and size with Ar-dose. At the highest Ardose, disordered regions dominate the structure, lending complications to AFM image interpretation. Surface hardness decreases with higher radiation doses, as evidenced by the greater ease of scraping through atomic layers in the more damaged samples.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 295: Symposium W – Atomic-Scale Imaging of Surfaces and Interfaces , 1992 , 139
Copyright
Copyright © Materials Research Society 1993

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