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Stress Development and Adhesion Behavior in Thin Ceramic Coatings Monitored by Positron Annihilation During Bending

Published online by Cambridge University Press:  21 March 2011

R. Escobar Galindo ,
A. van Veen ,
H. Schut ,
N.J.M. Carvalho ,
C. Strondl  and
J. Th. M. de Hosson
R. Escobar Galindo
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Delft, The Netherlands
A. van Veen
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Delft, The Netherlands
H. Schut
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Delft, The Netherlands
N.J.M. Carvalho
Affiliation:
Materials Science Centre and NIMR, University of Groningen, Groningen, The Netherlands
C. Strondl
Affiliation:
Hauzer Techno Coating, Venlo, The Netherlands.
J. Th. M. de Hosson
Affiliation:
Materials Science Centre and NIMR, University of Groningen, Groningen, The Netherlands
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Abstract

Positron Beam Analysis was for the first time performed in combination with a four-point bending stage. Applications of this novel technique on PVD TiN (5 m thick), WC:H (2.5 m) and CrN (1.5 m m) layers on tool steel, low carbon steel and stainless steel substrates are discussed. It appeared from PBA results that for these systems the coatings did not fail by delamination during bending. SEM confirmed that there was no decohesion but instead, cracking of the coatings was observed. In order to weaken the interface and quantify adhesion properties we propose to induce blistering based on localised gas implantation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 695: Symposium L – Thin Films: Stresses and Mechanical Properties IX , 2001 , L9.4.1
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

[1] Ernst, F.. Mat. Sci. Eng. R14, 97 (1995)Google Scholar
[2] A, van Veen, Schut, H., Fedorov, A.V., E.Neeft, A.C., Konings, R.J.M., Kooi, B.J., Hosson, J.Th.M. de. Nucl. Instr. and Meth., 147, pp.216–220, (1999)Google Scholar
[3] Veen, A. van. J. Trace and Microprobe Techniques 8 (1&2) (1990), pp.1–29.Google Scholar
[4] Veen, A. van, Schut, H., Vries, J. de, Hakvoort, R.A., Ijpma, M.R. in: Schultz, P.J., Massoumi, G.R., Simpson, P.J. (Eds.), AIP 218, Positron Beams for Solids and surfaces, (1990), pp.171–196.Google Scholar
[5] Fedorov, A.V., Veen, A. van, Schut, H., Proceedings ICPA-12 (Munich 6/12-8-2000), pp.646–648.Google Scholar
[6] Borisenko, Y.N., Gritsyna, V.T., Ivko, T.V.. J. Adhesion Sci. Technol. 9, 11, pp.1413–1426 (1995)Google Scholar
[7] Ziegler, J.F., Biersack, J.P., Littmark, U., The stopping of Ions in Solids. (TRIM), Pergamon Press, New York (1985)Google Scholar