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STM-Light Emission From Metal Deposited Semiconductor Surfaces

Published online by Cambridge University Press:  10 February 2011

N. Yamamoto ,
S. Kagami  and
H. Minoda
N. Yamamoto
Affiliation:
Dept. of Physics, Tokyo Institute of Technology, Meguro-ku, Tokyo 152–8551, Japan
S. Kagami
Affiliation:
Dept. of Physics, Tokyo Institute of Technology, Meguro-ku, Tokyo 152–8551, Japan
H. Minoda
Affiliation:
Dept. of Physics, Tokyo Institute of Technology, Meguro-ku, Tokyo 152–8551, Japan
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Abstract

Light detection system combined with a UHV-scanning tunneling microscope (STM) was applied to the study of silver films deposited on Si(111) surfaces. Photon maps clearly show single atom height steps and terraces on an Ag(111) surface with high spatial resolution of nanometer scale. Chemical reaction on the Ag surface with residual gas was clearly revealed in the photon map. In the photon map of the thin Ag film of 2˜3 ML in thick, no contrast appears between the terraces, and a characteristic bright contrast appears at the single atom height steps. The local plasmon model does not readily explain those contrasts.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 588: Symposium P – Optical Microstructural Characterization of Semiconductors , 1999 , 43
Copyright
Copyright © Materials Research Society 2000

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References

[1] Coombs, J. H., Gimzewski, J. K, Reihl, B., Sass, J. K and Schlitter, R. R., J. Microsc., 152, 325(1988).Google Scholar
[2] Gimzewski, J. K, KSass, J., Schlitter, R. R. and Schott, J., Europhys. Lett., 8(5), 435(1989)Google Scholar
[3] Berndt, R., Gimzewski, J. K and Johansson, P. Phys. Rev. Lett., 71, 3493(1993)Google Scholar
[4] Berndt, R. and Gimzewski, J. K, Phys.Rev.B 48, 4746(1993)Google Scholar
[5] Y Suzuki, Minoda, H. and Yamamoto, N., Surf. Sci. 438, 297(1999)Google Scholar
[6] Downes, A. and Welland, M. E., Phys. Rev. Lett. 81, 1857(1998)Google Scholar