Hostname: page-component-7bb8b95d7b-cx56b Total loading time: 0 Render date: 2024-09-19T00:15:27.735Z Has data issue: false hasContentIssue false
  • English
  • Français

Nano-Encapsulated ZnS:Ag Phosphors for Field Emission Flat Panel Display Applications

Published online by Cambridge University Press:  17 March 2011

Michael Ollinger ,
Valentin Craciun  and
Rajiv K. Singh
Michael Ollinger
Affiliation:
Department of Materials Science & Engineering, University of Florida, Gainesville, FL 32611, U.S.A.
Valentin Craciun
Affiliation:
Department of Materials Science & Engineering, University of Florida, Gainesville, FL 32611, U.S.A.
Rajiv K. Singh
Affiliation:
Department of Materials Science & Engineering, University of Florida, Gainesville, FL 32611, U.S.A.
Get access

Abstract

ZnS:Ag phosphor particles were encapsulated with nano-meter thick films of indium tin oxide (ITO) in order to slow the degradation process of the phosphor as well as to reduce the amount of sulfur species out-gassing from the phosphor. Cathodoluminescent (CL) degradation measurements were performed at two different vacuum conditions (6.1–10-7 Torr and 1–10-5 Torr). The CL degradation curves showed that the ITO coating improved the brightness lifetime. X-ray photoelectron spectroscopy was used to determine the chemical changes on the coated and uncoated degraded particle surfaces. CL images were used to show the loss of brightness from the surface of the phosphor particles. Then energy dispersive x-ray spectroscopy was used to measure the ratio of the area under the zinc and sulfur peaks on an atomic weight %, which showed a loss in sulfur during the degradation experiments.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 704: Symposium W – Nanoparticulate Materials , 2001 , W8.4.1
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Oosthuizen, L., Swart, H. C., Viljoen, P. E., Holloway, P. H., and Berning, G. L. P., Appl. Surf. Sci. 120, 9 (1997).Google Scholar
2. Swart, H. C., Greeff, A. P., Holloway, P. H., and Berning, G. L. P., Appl. Surf. Sci. 140, 63 (1999).Google Scholar
3. Fitz-Gerald, J., Trottier, T. A., Singh, R. K., and Holloway, P. H., Appl. Phys. Let. 72, 1838 (1998).Google Scholar
4. Igarashi, T., Kusunoki, T., Ohno, K., Isobe, T., and Senna, M., Mat. Res. Bull. 36, 1317 (2001).Google Scholar
5. Souriau, J. C., Jiang, Y. D., Penczek, J., Paris, H. G., and Summers, C. J., Mat. Sci. Eng. B 76, 165 (2000).Google Scholar
6. Fitz-Gerald, J. M., Singh, R. K., Gao, H., Wright, D., Ollinger, M., Marcinka, J. W., Pennycook, S.J., J. Mat. Res. 14, 3281 (1999).Google Scholar
7. Deroubaix, G. and Marcus, P., Surf. Interf. Anal. 18, 39 (1992).Google Scholar
8. Gao, H. J., Duscher, G., Kim, M., and Pennycook, S. J., Kumar, D., Cho, K. G., and Singh, R. K., Appl. Phys. Let. 77, 594 (2000).Google Scholar
9. Lakshmikumar, S. T., and Rastogi, A. C., Thin Solid Films 259, 150–153 (1995).Google Scholar
10. Futsuhara, M., Yoshioka, K., and Takai, O., Thin Solid Films 322, 274–281 (1998).Google Scholar