Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-18T18:48:27.429Z Has data issue: false hasContentIssue false
  • English
  • Français

The Debye temperature of nanocrystalline β–Sn measured by x-ray diffraction

Published online by Cambridge University Press:  03 March 2011

L.B. Hong ,
C.C. Ahn  and
B. Fultz
L.B. Hong
Affiliation:
Division of Engineering and Applied Science, 138-78, California Institute of Technology, Pasadena, California 91125
C.C. Ahn
Affiliation:
Division of Engineering and Applied Science, 138-78, California Institute of Technology, Pasadena, California 91125
B. Fultz
Affiliation:
Division of Engineering and Applied Science, 138-78, California Institute of Technology, Pasadena, California 91125
Get access

Abstract

A nanocrystalline β–Sn film of 7 nm average grain size was prepared by inert gas condensation followed by ballistic consolidation, and was investigated by x-ray diffractometry at temperatures of 77 and 293 K. Although Sn normally undergoes a βα phase transformation at 286 K, this transformation was suppressed in the nanocrystalline film. Compared with large-grained β-Sn, a larger Debye–Waller factor and a lower Debye temperature were measured for nanocrystalline β-Sn; ΘD = 133 K for nanocrystalline material while ΘD = 161 K for large-grained material. The lower Debye temperature of the nanocrystalline β-Sn indicates that its vibrational entropy is increased by 0.6 kB/atom with respect to large-grained material.

Type
Rapid Communication
Information
Journal of Materials Research , Volume 10 , Issue 10 , October 1995 , pp. 2408 - 2410
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Gleiter, H., Mat. Sci. Eng. 52, 92 (1982).CrossRefGoogle Scholar
2Gleiter, H., Prog. Mater. Sci. 33, 223 (1989).CrossRefGoogle Scholar
3Herr, U., Jing, J., Birringer, R., Gonser, U., and Gleiter, H., Appl. Phys. Lett. 50, 472 (1987).CrossRefGoogle Scholar
4Jiang, J., Ramasamy, S., Birringer, R., Gonser, U., and Gleiter, II., Solid State Commun. 80, 525 (1991).CrossRefGoogle Scholar
5Hellstern, E., Fecht, H. J., Fu, Z., and Johnson, W. L., J. Appl. Phys. 65, 305 (1989).CrossRefGoogle Scholar
6Rupp, J. and Birringer, R., Phys. Rev. B 36, 7888 (1987).CrossRefGoogle Scholar
7Eastman, J. A., Fitzsimmons, M. R., and Thompson, L. J., Philos. Mag. B 66, 667 (1992).CrossRefGoogle Scholar
8Ahn, C. C. and Hong, L. B., unpublished.Google Scholar
9Mitchell, D. R. G. and Donnelly, S. E., Philos. Mag. A 63, 747 (1991).CrossRefGoogle Scholar
10Warren, B. E., X-Ray Diffraction (Addison-Wesley, Reading, MA, 1969), Chap. 11.Google Scholar
11American Institute of physics Handbook, 3rd ed. (American Institute of Physics, New York, 1972), pp. 4–116.Google Scholar
12De Sorbo, W., Acta Metall. 2, 274 (1954).CrossRefGoogle Scholar
13Corak, W. S. and Satterthwaite, C. B., Phys. Rev. 102, 662 (1956).CrossRefGoogle Scholar
14Brovman, E. G. and Kagan, Yu., Dov. Phys. Solid State 8, 1120 (1966).Google Scholar
15Tuijn, C. and Bakker, H., Phys. Status Solidi B 155, 107 (1989).CrossRefGoogle Scholar
16Kubaschewski, O., Metallurgical Thermodynamics (Pergamon, London, 1967).Google Scholar
17de Launay, J., Solid State Physics, edited by Seitz, F. and Tumbull, D. (Academic Press, New York, 1956), Vol. 2.Google Scholar