Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-17T17:58:27.204Z Has data issue: false hasContentIssue false
  • English
  • Français

Radiation effects on Gaia CCDs, Modelling to mitigate thethreat

Published online by Cambridge University Press:  15 February 2011

C. Turon ,
F. Meynadier ,
F. Arenou  and
T. Prod’homme
T. Prod’homme*
Affiliation:
Leiden Observatory, Leiden University, PO Box 9513, 2300 RA Leiden, The Netherlands. e-mail: prodhomme@strw.leidenuniv.nl
Get access

Abstract

This paper describes the damage occurring in CCDs exposed to solar radiation and explainsits implications for the Gaia measurements by focusing on the astrometric instrument. Itintroduces the strategy that will be used in the Gaia data processing to mitigate theradiation induced effects, and presents CEMGA (CTI effects Models for Gaia) amulti-purpose platform which hosts different models that simulate radiation effects onCCDs.

Type
Research Article
Information
European Astronomical Society Publications Series , Volume 45: GAIA: At the Frontiers of Astrometry , 2010 , pp. 55 - 60
Copyright
© EAS, EDP Sciences 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Références

Fusero, F., 2007, Technical report, Gaia Livelink, GAIA-ASF-TCN-SAT-00035
Lindegren, L., 2008, Technical report, Gaia Livelink, GAIA-C3-TN-LU-LL-075
Prod’homme, T., Weiler, M., Brown, S.W., Short, A.D.T., & Brown, A.G.A., 2010, Proc. SPIE, 7742
Prod’homme, T., Brown, A.G.A., Lindegren, L., & Short, A., 2010, in preparation
Seabroke, G., Holland, A., & Cropper, M., 2008, Proc. SPIE, 7021
Short, A.D.T., Prod’homme, T., Weiler, M., Brown, S.W., & Brown, A.G.A., 2010, Proc. SPIE, 7742
van Leeuwen, F., Lindegren, L., 2007, Technical report, Gaia Livelink, GAIA-C5-TN-IOA-FVL-006
van Leeuwen, F., 2007, Technical report, Gaia Livelink, GAIA-C5-TN-IOA-FVL-009