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Results of the JCPDS-ICDD Intensity Round Robin

Published online by Cambridge University Press:  06 March 2019

Walter N. Schreiner  and
Ron Jenkins
Walter N. Schreiner
Affiliation:
Philips Laboratories, Briarcliff Manor, NY 10510
Ron Jenkins
Affiliation:
JCPDS International Centre, Swarthmore, Pa 19081
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Extract

Last year at this conference we submitted a preliminary report on an X-ray powder diffraction round robin sponsored by the JCPDS-ICDD. This round robin was designed primarily to study the intensities of diffraction lines found by users in routine work. At that time only a portion of the data had been analyzed, and we reported initial findings on the α-Al2O3, and Zn0 /CaCO3 samples. These included studies on counting statistics, resolution, and the effect of software on intensity precision. Since that time, all the data from the round robin has been entered into Lotus 1-2-3 (*) spread-sheets and numerous additional tests have been carried out. This paper discusses some of the more interesting findings. A complete paper on all of the tests performed is in preparation for submission to the "Methods and Practices Manual" published by the JCPDS-ICDD.

Type
IX. Qualitative and Quantitative Phase Analysis Diffraction Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 557 - 560
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

[1] “Preliminary Results from a Powder Diffraction Data Intensity Round-Robin”, W,N. Schreiner, R. Jenkins, 1987 Denver Conference (in preparation).Google Scholar
[2] Methods and Practices in X-ray Powder Diffraction, R. Jenkins, Ed. , (1987), International centre for Diffraction Data, 1601 Park Lane, Swarthmore, PA 19081Google Scholar
[3] “Towards Improved Alignment of Powder Diffractometers”, Schreiner, W.N., Powder Diffr. Vol. 1, pp 25-33, (March 1986).Google Scholar
[4] Micro-Powd Version 1. 01 for IBM PC, Smith, D.K., Marketed by Materials Data, Inc. , Livermore, CA 94550.Google Scholar
[5] “Observed and Calculated XRPD Intensities for Single Substance Specimens”, Schreiner, W.N., G. , Kimmel, Adv. X-Ray Anal., 30, 351-356, (1987).Google Scholar