Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Atomic Structure of the Polarization Modulations in Perovskite Antiferroelectrics

A STEM-EELS Investigation of La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 Multilayer Thin Films

Quantitative Aberration-Corrected STEM for Studies of Oxide Superlattices and Topological Defects in Layered Ferroelectrics

High-Resolution STEM/STEM-EELS Characterization of Entropy-stabilized Oxides Thin Films

Fe-rich Phase Separation in Doped BaTiO3 as Revealed by STEM-EDS

Low Count Detection for EELS Spectrum by Reducing CCD Read-out Noise

Low-voltage STEM-EELS Quantification for Beam Sensitive Material Characterization

Improving the Energy Resolution of Energy Dispersive Spectrometers(EDS) Using Richardson–Lucy Deconvolution

Measuring the Thickness of 2D Materials Using EDS

Analysis of the Dose-Limited Spatial Resolution in Transmission Electron Microscopy

Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?

High Resolution Imaging of Dislocations Using Weak Beam Dark Field STEM

Preparation of TEM Samples from Specific Orientations Using FIB-SEM

Nanoparticle Temperature Measurements for MEMS Heater Calibration

Atomic Distribution of Al and Phase Transformation in β-(AlxGa1-x)2O3

Study of Arsenic Doped CdSeTe Solar Cells Using Transmission Electron Microscopy

Atomic-resolution Observations of Grain Boundary Segregation in Multiphase Ceramics by Aberration-corrected STEM

X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis

New EPMA Applications Utilizing Novel High-current, High-spatial Resolution Field Emission Optics

Structure Investigation of ZrO2 Fiber Insulation Tile by Using Synchrotron X-ray In-line Phase Contrast Microtomography

TEM Sample Preparation of Heterogeneous Catalyst (Zeolite) Extrudates

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis