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Low Count Detection for EELS Spectrum by Reducing CCD Read-out Noise

Published online by Cambridge University Press:  30 July 2020

Mitsutaka Haruta ,
Yoshifumi Fujiyoshi ,
Takashi Nemoto ,
Akimitsu Ishizuka ,
Kazuo Ishizuka  and
Hiroki Kurata
Mitsutaka Haruta
Affiliation:
Kyoto University, Uji, Kyoto, Japan
Yoshifumi Fujiyoshi
Affiliation:
Kyoto University, Uji, Kyoto, Japan
Takashi Nemoto
Affiliation:
Kyoto University, Uji, Kyoto, Japan
Akimitsu Ishizuka
Affiliation:
HREM Research Inc., Higashimatsuyama, Saitama, Japan
Kazuo Ishizuka
Affiliation:
HREM Research Inc., Higashimatsuyama, Saitama, Japan
Hiroki Kurata
Affiliation:
Kyoto University, Uji, Kyoto, Japan

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1202 - 1204
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Copyright
Copyright © Microscopy Society of America 2020

References

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