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A STEM-EELS Investigation of La0.7Sr0.3CrO3/La0.7Sr0.3MnO3 Multilayer Thin Films

Published online by Cambridge University Press:  30 July 2020

Aubrey Penn ,
Sanaz Koohfar ,
Divine Kumah  and
James LeBeau
Aubrey Penn
Affiliation:
North Carolina State University, Raleigh, North Carolina, United States
Sanaz Koohfar
Affiliation:
North Carolina State University, Raleigh, North Carolina, United States
Divine Kumah
Affiliation:
North Carolina State University, Raleigh, North Carolina, United States
James LeBeau
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1192 - 1193
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Copyright
Copyright © Microscopy Society of America 2020

References

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Koohfar, S., et al. (2019). Npj Quantum Materials, 4(1), 25.10.1038/s41535-019-0164-1CrossRefGoogle Scholar
Orgiani, P., et al. (2012). Applied Physics Letters, 100(4), 042404.10.1063/1.3676268CrossRefGoogle Scholar
This work is supported by the National Science Foundation (DMR-1350273). The authors also acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation.Google Scholar