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Quantitative Aberration-Corrected STEM for Studies of Oxide Superlattices and Topological Defects in Layered Ferroelectrics

Published online by Cambridge University Press:  30 July 2020

Albina Borisevich ,
Rama Vasudevan ,
Yu Zhou ,
Kyle Kelley ,
Donovan Leonard ,
Summayya Kouser ,
Sabine Neumayer ,
Peter Maksymovych ,
Sokrates Pantelides  and
Steven May
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Albina Borisevich
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Rama Vasudevan
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Yu Zhou
Affiliation:
Drexel University, Philadelphia, Pennsylvania, United States
Kyle Kelley
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Donovan Leonard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Summayya Kouser
Affiliation:
Vanderbilt University, Nashville, Tennessee, United States
Sabine Neumayer
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Peter Maksymovych
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Sokrates Pantelides
Affiliation:
Vanderbilt University, Nashville, Tennessee, United States
Steven May
Affiliation:
Drexel University, Philadelphia, Pennsylvania, United States
Nina Balke
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1194 - 1195
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Copyright
Copyright © Microscopy Society of America 2020

References

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Research was sponsored by the Division of Materials Science and Engineering, Basic Energy Sciences (BES), Office of Science, US Department of Energy (DOE).Google Scholar