Hostname: page-component-7bb8b95d7b-dvmhs Total loading time: 0 Render date: 2024-09-12T10:03:58.029Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of the Dose-Limited Spatial Resolution in Transmission Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Eduardo Ortega  and
Niels de Jonge
Eduardo Ortega
Affiliation:
INM - Leibniz Institute for New Materials, Saarbrücken, Saarland, Germany
Niels de Jonge
Affiliation:
INM - Leibniz Institute for New Materials, Saarbrücken, Saarland, Germany Department of Physics, Saarland University, Saarbrücken, Saarland, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1216 - 1217
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Pan, M and Crozier, PA, Ultramicroscopy 52 (1993) p. 487.10.1016/0304-3991(93)90065-6CrossRefGoogle Scholar
Reimer, L and Kohl, H 2008 Transmission electron microscopy: physics of image formation (New York: Springer).Google Scholar
de Jonge, N, Ultramicroscopy 187 (2018) p. 113.10.1016/j.ultramic.2018.01.007CrossRefGoogle Scholar
de Jonge, N et al. Ultramicroscopy 110 (2010) p. 1114.10.1016/j.ultramic.2010.04.001CrossRefGoogle Scholar
The authors thank E. Arzt for his support through INM. The research was supported by the German Research Foundation.Google Scholar