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Microscopy and Microanalysis

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Approaching Operando Imaging of Functional Materials

Charge Carriers in Dynamic Ferroelectric Domain Walls

Electron Correlation Microscopy Measurements of Metallic Glass Surface Dynamics

Microreactor for Clean and Controlled In-situ SEM Imaging of CVD Processes

An Atomic Level Study of Local Strain Fields on Multiple Low-index Ceria (CeO2) Nanoparticle Surfaces

Enabling Kinetically-unfavorable Phase Transformation Mechanisms with Plasmonics

TV-rate Atomic-resolution STEM Imaging

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Electrochemistry in an MeV UED System: The Structural Dynamics of In Situ Lithium-intercalated WTe2

Probing the Surface Photovoltage Effect by Imaging Photo-assisted Secondary Electron Emission

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Efficient Skeleton Editing in a VR Environment Facilitates Accurate Modeling of Highly Branched Mitochondria.

Feature Parameter Design Using Cross-sectional SEM for Machine Learning-based Optimization in Plasma Etching

Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection

cloudEMAPS: A Cloud Computing Environment for Electron Microscopy Application Simulations

How the Observation in a New Custom Basis Based on Orbital Angular Momentum Space Could Improve Our Dose Effective Reconstruction of the Protein Structure.

Laboratory Scale Photogrammetry: Micro- and Macroscopic 3D Surface Imaging

Data Processing Using Python in DigitalMicrograph

Quantitative Image Format for Electron Microscopy

Imaging of Electrons with Tracking and Counting Detectors for (S)TEM Applications

Offline Secondary Electron Counting and Conditional Re-illumination in SEM

A New Energy-filtering EBSD/TKD Direct Detector

Towards Automated Electron Microscopy Image Segmentation for Nanoparticles of Complex Shape by Convolutional Neural Networks

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Approaching Operando Imaging of Functional Materials

Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems