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A New Energy-filtering EBSD/TKD Direct Detector

Published online by Cambridge University Press:  30 July 2020

Benjamin Bammes
Affiliation:
Direct Electron, LP, San Diego, California, United States
Robert Bilhorn
Affiliation:
Direct Electron, LP, San Diego, California, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Copyright
Copyright © Microscopy Society of America 2020

References

Schwarzer, R.A., Field, D.P., Adams, B.L., Kumar, M., & Schwartz, A.J. (2009). Present state of electron backscatter diffraction and prospective developments. Electron backscatter diffraction in materials science, Springer: 120.Google Scholar
Wilkinson, A.J., Moldovan, G., Britton, T.B., Bewick, A., Clough, R.N., & Kirkland, A.I. (2013). Direct Detection of Electron Backscatter Diffraction Patterns. Physical Review Letters, 111: 065506.10.1103/PhysRevLett.111.065506CrossRefGoogle ScholarPubMed
Britton, T.B., Maurice, C., Fortunier, R., Driver, J.H., Day, A.P., Meaden, G., Dingley, D.J., Mingard, K., & Wilkinson, A. J. (2010). Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. Ultramicroscopy 110: 14431453.10.1016/j.ultramic.2010.08.001CrossRefGoogle ScholarPubMed
Deal, A., Hooghan, T., & Eades, A. (2008). Energy-filtered electron backscatter diffraction. Ultramicroscopy 108: 116125.10.1016/j.ultramic.2007.03.010CrossRefGoogle ScholarPubMed
We thank Earl Weltmer at ScanService (Tustin, CA), who provided access to an SEM for sensor characterization.Google Scholar
This material is based upon work supported by the U.S. Department of Energy, Office of Science, under Award Number DE-SC0019681.Google Scholar