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High-Resolution STEM/STEM-EELS Characterization of Entropy-stabilized Oxides Thin Films

Published online by Cambridge University Press:  30 July 2020

Leixin Miao ,
George Kotsonis ,
Jon-Paul Maria  and
Nasim Alem
Leixin Miao
Affiliation:
Pennsylvania State University, University Park, Pennsylvania, United States
George Kotsonis
Affiliation:
Pennsylvania State University, University Park, Pennsylvania, United States
Jon-Paul Maria
Affiliation:
Pennsylvania State University, University Park, Pennsylvania, United States
Nasim Alem
Affiliation:
Pennsylvania State University, University Park, Pennsylvania, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1196 - 1197
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Copyright
Copyright © Microscopy Society of America 2020

References

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