Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies

Investigating Ferroelectric Domain and Domain Wall Dynamics at Atomic Resolution by TEM/STEM in situ Heating and Biasing

In situ STEM Mechanical Experiments at Atomic-Resolution Using a MEMS Device

Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films

The in situ Studies on the Anomalous Domain Switching Caused by Trace Amount of Oxygen Vacancies

In situ Transmission Electron Microscopy Annealing for Crystallization and Phase Stability Studies in the Ga2O3-In2O3 System

Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations

Atomic and Electronic Reconstruction at the a-LAO/STO Interface by E-Beam Induced Crystallization

In Situ Phase Transformation of Monodisperse Manganese Oxide Nanoparticles

In Situ TEM Study of Friction and Wear of Olivine

Size Effect of Charge Density Wave Phase Transformation in EuGa4 Compound Nanoparticles

Accelerated Electromigration Study of Cobalt Thin Films by In-Situ TEM

Electronic Biasing of Monolayer Transition Metal Dichalcogenides in a TEM

Operando TEM Investigation of Sintering Kinetics of Nanocatalysts on MoS2 in Hydrogen Environment

Electron-Beam Manipulated Nanoscale Reaction

Direct Visualization of Polar Nanoregions in BaTiO3-based Ferroelectrics Above Curie Temperature

In-Situ Observation of Concurrent Oxidation and Mechanical Deformation in Al and Zr

Phase Stability of Iron Oxide Evaluated Through Selected Area Electron Diffraction During In-Situ Heating Experiments

Characterisation of Misfit Dislocations at Semicoherent Interfaces in Biphasic Functional Heusler Intermetallics

Electron Microscopy and Spectroscopy Characterization of the Effects of Annealing on the Cu/Graphene/Si Multilayer Thin Films

Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences

Scanning Precession Electron Diffraction to aid Aluminum Alloy Development

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies

Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences