Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope

High-Quality Experimental Data in Electron Microscopy and Microanalysis – What Can, and Should We Jointly Do?

Carbon Analysis in Steels by FE-EPMA: A Challenge or Contradiction?

Analysis and Quantification of Transition Metal Borides with WDS and EDS

Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium

Analysis of elemental composition and porosity of mesoporous iridium-titanium mixed oxide thin films for energy application by SEM/EDS

Quantitative Chemical Mapping of Anisotropic Molecular Distributions on Gold Nanorods

Sub-nm Spectroscopic Mapping of Highly Beam Sensitive Species Using Direct Detection Electron Energy Loss Spectroscopy

STEM and Elemental Analysis by EDS and EELS for Two-dimensional Atomic Structure Containing Au and Cu

Nanoscale Correlative Imaging of Low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope

Monolayer-like Behavior of Bilayer Transition-Metal Dichalcogenides

Graphite Nanoplatelets in Elastomer Composites

A Case-Study of Bubble Formation Mechanism by Analytical TEM during Evaluation of an Incoming Spin-On-Hardmask at Wafer-Foundries

Analysis of Elemental Composition of Fe1−xNix and Si1−xGex Alloy Thin Films by EPMA and μ-XRF

HAADF-STEM Study of Filament Material in Hot Filament CVD Diamond Films

Synthesis and Analysis Microstructural of CeO2 Nanoparticles Using Chelating Agents

Hydrothermal Synthesis of Nanohybrid Gr-CeO2

Microstructural, Structural and Mechanical Behavior of WC-Based Hardmetals Bonded with High and Medium Entropy Alloys.

Raman Characterization of LiNbO3 Nanofibers Doped with Mn

Energy Dispersive X-ray Spectroscopic Analysis of Al-Cu-Fe Quasicrystalline Thin Film Layer

Correlative STEM and SEM Imaging of PTB7:PC71BM-Based Photoactive Layers in a Scanning Electron Microscope

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope