Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions

Atomic-Scale Characterization Reveals Core-Shell Structure of Enamel Crystallites

Imaging Metal−Organic Frameworks (MOFs) Using Cryo-TEM and Direct Electron-Detection Camera

Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope

Imaging and Spectroscopy of Low-Dimensional Low-Z Materials by 20-300kV TEM

New metastable carbon phases observed by HRTEM

Probing The Mechanical Properties of Few-Layer Graphene with Aberration-Corrected, Low-Voltage STEM

Imaging Low Z Materials in Crystalline Environments Via Scanning Transmission Electron Microscopy

Imaging and analysis of low atomic number materials in the STEM

Aberration-Corrected STEM Analysis of Impurities in Cosmic Nanodiamonds and Synthetic Analogs

Scan Strategies for Electron Energy Loss Spectroscopy at Optical and Vibrational Energies in Perylene Diimide Nanobelts

Aggregation Behavior of Detonation Nanodiamond in Solution

Transmission Electron Microscopy of Gas-Supersaturated Water Encapsulated in Graphene Liquid Cells

“Hybrid” Microscopy: Multimodal, Correlative and Dynamic Characterization of Soft and Hybrid Structures

Low-Dose Scanning Electron Diffraction Microscopy of Mechanochemically Nanostructured Pharmaceuticals

Explaining the Magnetic Properties of Oxygen Deficient LSMO Thin Films by iDPC

Combined imaging and analytical STEM of ultra-thin cuprate films

4D-STEM Characterization of Molecular Ordering in Organic Semiconductors

Chemical State Mapping of Amorphous Carbon Films by Soft X-ray Emission Spectroscopy

Microstructural and Analytic Characterisation of Li-Ion Batteries by Correlative EDS, SIMS, Light-, Raman-, Ion- and Electron Microscopy

The Benefits of Correlative Scanning Electron - and Confocal Raman Microscopy for the Characterization of Polymers, 2D Materials and Lithium Oxides

Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions

Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope