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Imaging and analysis of low atomic number materials in the STEM

Published online by Cambridge University Press:  05 August 2019

Jessica A. Alexander ,
Michael Chilcote ,
Ezekiel Johnston-Halperin  and
David W. McComb
Jessica A. Alexander
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, United States.
Michael Chilcote
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, United States.
Ezekiel Johnston-Halperin
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, United States.
David W. McComb*
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, United States.
*
*Corresponding author: mccomb.29@osu.edu

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1734 - 1735
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Alexander, JA et al. , J. Mater. Chem. A 4 (2016), p. 13636.Google Scholar
[2]Alexander, JA et al. , Ultramicroscopy 180 (2017), p. 125.Google Scholar
[3]Yu, H et al. , Appl. Phys. Lett. 105 (2014), 012407.Google Scholar
[4]Hart, JL et al. , Scientific Reports 7 (2017), p. 8243.Google Scholar
[5]Funding was provided by an AFRL/DAGSI Ohio-Student Faculty Research Fellowship awarded by the Air Force Laboratory Manufacturing and Materials Directorate, and by The Ohio State University through a Distinguished University FellowshipGoogle Scholar