Microscopy and Microanalysis: Volume 25 - Issue S2

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies

Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation

In situ Electric Field Manipulation of Ferroelectric Vortices

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

Direct Observation of Field-induced Modulation of Two-dimensional Electron Gas at Oxide Interfaces

Atomic Resolution Probing of Phase Transformations and Domain Evolution During Large Superelastic Deformation in Ferroelectrics with in situ TEM

Unraveling the Relationship Between Layer Stacking and Magnetic Order in Nb3X8 Systems via Controlled-Temperature Cryo-STEM

Developing Multifunctional and High Resolution In-situ TEM Holders

In Situ Analytical Electron Microscopy and Cryogenic Electron Microscopy for Characterizing Nanoscale Materials in Electrochemical Process

Investigation of the Oxidation Reaction of LiFePO4 Cathode Material using Environmental TEM

Facile in situ Lithiation and Sodiation Observation in TEM Employing MF (M=Li, Na)

In Situ Electron Microscopy for Electrically Induced Charge Transport and Phase Transformation

In situ S/TEM Heating Experiments to Study the Effects of Cyclic Thermal Gradients in Additive Manufacturing Build Processes

In situ Atomic Scale Observation of Cu2O Reduction Under Methanol

TiO2 Phase Transformation Mechanisms at Atomic Scale under Heating and Electron Beam Irradiation

Self-Healing of a Confined Phase Change Memory Device with a Metallic Surfactant Layer

In situ Observation of Oxygen Vacancy Order-Disorder Transition in NdBaCo2O5.5 Layered Perovskite Oxide

Tracking Metastable Phase Selection during Devitrification in a Metallic Glass

High Resolution S/Transmission Electron Microscopy Investigation of Ca3Mn2O7 Phase Transformation under In-situ Heating Condition

Advanced and In-Situ Electron Microscopy Investigation of Phase Composition and Phase Transformation in Ga-Rh Liquid Metal Catalysts

Nanoscale Deformation Processes Revealed in Nacre of Pinna nobilis Mollusk Shells

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies