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In Situ Electron Microscopy for Electrically Induced Charge Transport and Phase Transformation

Published online by Cambridge University Press:  05 August 2019

Kai He
Kai He*
Affiliation:
Department of Materials Science and Engineering, Clemson University, Clemson, USA
*
*Corresponding author: kaihe@clemson.edu

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1862 - 1863
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zheng, H, Meng, YS and Zhu, Y, MRS Bulletin 40, 12 (2015).Google Scholar
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[3]Kim, S et al. , ACS Nano, 12, 7335 (2018).Google Scholar
[4]He, K et al. Nanotechnology 24, 115703 (2013).Google Scholar
[5]Kim, S et al. Adv. Mater. 30, 1804925 (2018).Google Scholar
[6]Terhune, KJ, King, LB, He, K and Cumings, J, Nanotechnology 27, 375701 (2016).Google Scholar
[7]The authors acknowledge the use of facilities at EM Facility of Clemson University, NUANCE-EPIC Center of Northwestern University, and CFN of Brookhaven National Laboratory.Google Scholar