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Self-Healing of a Confined Phase Change Memory Device with a Metallic Surfactant Layer

Published online by Cambridge University Press:  05 August 2019

Yujun Xie ,
W. Kim ,
Y. Kim ,
S. Kim ,
J. Gonsalves ,
M. BrightSky ,
C. Lam ,
Y. Zhu  and
J. J. Cha
Yujun Xie
Affiliation:
Department of Mechanical Engineering and Materials Science, Yale University, New Haven, USA. Energy Sciences Institute, Yale West Campus, West Haven, USA
W. Kim
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, USA
Y. Kim
Affiliation:
Energy Sciences Institute, Yale West Campus, West Haven, USA
S. Kim
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, USA
J. Gonsalves
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, USA
M. BrightSky
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, USA
C. Lam
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, USA
Y. Zhu
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, USA
J. J. Cha*
Affiliation:
Department of Mechanical Engineering and Materials Science, Yale University, New Haven, USA. Energy Sciences Institute, Yale West Campus, West Haven, USA
*
*Corresponding author: judy.cha@yale.edu

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1870 - 1871
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wong, H.-S. P., et al. , IEEE 98 (2010), p.2201.Google Scholar
[2]Tuma, T., et al. , Nat. Nanotechnol. 11 (2016), p.693.Google Scholar
[3]Kim, W., et al. , IEDM Tech. Dig. (2016) p.4.2.1.Google Scholar
[4]Xie, Y., et al. , Adv. Mater. 30 (2018), 1705587.Google Scholar