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Atomic Resolution Probing of Phase Transformations and Domain Evolution During Large Superelastic Deformation in Ferroelectrics with in situ TEM

Published online by Cambridge University Press:  05 August 2019

Y Deng ,
C Gammer ,
J Ciston ,
Peter Ercius ,
C Ophus ,
KC Bustillo ,
Chengyu Song ,
Ruopeng Zhang  and
AM Minor
Y Deng*
Affiliation:
Physics School and Modern Analysis Center, Nanjing University, Nanjing, China.
C Gammer
Affiliation:
Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria.
J Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
C Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
KC Bustillo
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Chengyu Song
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Ruopeng Zhang
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. Department of Materials Science & Engineering, University of California, Berkeley, CA, USA.
AM Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. Department of Materials Science & Engineering, University of California, Berkeley, CA, USA.
*
*Corresponding author: dengyu@nju.edu.cn

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1850 - 1851
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Catalan, G et al. , Rev. Modern Phys. 84 (2012), p. 119.Google Scholar
[2]Scott, JF, Science 315 (2007), p. 954.Google Scholar
[3]Tang, YL et al. , Science 348 (2015), p. 547.Google Scholar
[4]Gammer, C et al. , Ultramicroscopy 1 (2015), p. 155.Google Scholar
[5]Ozdol, VB et al. , Applied Physics Letters 106 (2015), p. 253107.Google Scholar
[6]The authors acknowledge support by the National Natural Science Foundation of China (Grants Nos. 50802039) and Natural Science Foundation of Jiangsu Province, China (Grant Nos. BK20151382), and the National Science Foundation through the STROBE Science and Technology Center. RZ acknowledges funding from the US Office of Naval Research under Grant No. N00014-12-1-0413 and N00014-17-1-2283. The electron microscopy work was performed at the Molecular Foundry, Lawrence Berkeley National Laboratory, which is supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Dept. of Energy under Contract # DE-AC02-05CH11231. J.C. acknowledges additional support from the Department of Energy Early Career Research Program.Google Scholar