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In Situ Analytical Electron Microscopy and Cryogenic Electron Microscopy for Characterizing Nanoscale Materials in Electrochemical Process

Published online by Cambridge University Press:  05 August 2019

Minghao Zhang ,
Xuefeng Wang  and
Ying Shirley Meng
Minghao Zhang
Affiliation:
Department of NanoEngineering, University of California San Diego, La Jolla, USA
Xuefeng Wang
Affiliation:
Department of NanoEngineering, University of California San Diego, La Jolla, USA
Ying Shirley Meng*
Affiliation:
Department of NanoEngineering, University of California San Diego, La Jolla, USA
*
*Corresponding author: shmeng@ucsd.edu

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1856 - 1857
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]We are grateful for financial support from the Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Vehicle Technologies of the U.S. Department of Energy under the Battery500 Consortium. This research was also sponsored by the Materials Sciences and Engineering Division of the U.S. Department of Energy (DOE), Office of Basic Energy Sciences (BES), and was performed at the Center for Nanophase Materials Sciences (CNMS) at Oak Ridge National Laboratory (ORNL), which is a DOE Office of Science User Facility.Google Scholar