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Sub-nm Spectroscopic Mapping of Highly Beam Sensitive Species Using Direct Detection Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  05 August 2019

M. Cem Akatay
M. Cem Akatay*
Affiliation:
UOP LLC, A Honeywell Company, Des Plaines, Illinois, USA.
*
*cem.akatay@honeywell.com

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1774 - 1775
Copyright
Copyright © Microscopy Society of America 2019 

References

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[4]Hart, JL, Lang, AC, Trevor, C, Twesten, R, Taheri, ML, Microsc. Microanal. 22 (S3) (2016), p. 336Google Scholar