Hostname: page-component-848d4c4894-cjp7w Total loading time: 0 Render date: 2024-07-03T23:37:37.688Z Has data issue: false hasContentIssue false
  • English
  • Français

Sub-nm Spectroscopic Mapping of Highly Beam Sensitive Species Using Direct Detection Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  05 August 2019

M. Cem Akatay
M. Cem Akatay*
Affiliation:
UOP LLC, A Honeywell Company, Des Plaines, Illinois, USA.
*
*cem.akatay@honeywell.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1774 - 1775
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Meyer, JC, Kotakoski, J., Mangler, C., Ultramicroscopy 145 (2014) 13Google Scholar
[2]Hart, JA et al. , Scientific Reports 7 (2017) 8243Google Scholar
[3]Ruskin, RS, Yu, Z, and Grigorieff, N, J. Struct. Biol. 184 (2013), p. 385Google Scholar
[4]Hart, JL, Lang, AC, Trevor, C, Twesten, R, Taheri, ML, Microsc. Microanal. 22 (S3) (2016), p. 336Google Scholar