No CrossRef data available.
Article contents
Nanoscale Correlative Imaging of Low-Z elements by in-situ Secondary Ion Mass Spectrometry in a Transmission Electron Microscope
Published online by Cambridge University Press: 05 August 2019
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Williams, DB and Carter, CB, The Transmission Electron Microscope (Springer US, Boston, MA, 2009).Google Scholar
[2]Benninghoven, A, Rüdenauer, FG, and Werner, HW, Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends (J. Wiley, New York, 1987).Google Scholar
[5]The authors acknowledge funding from the LowZ-PIES (C13/MS/5951975) and the NACHOS (INTER/SNF/16/11536628) projects funded by the Luxembourg National Research Fund (FNR) by the grant.Google Scholar
You have
Access