Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-16T23:52:34.839Z Has data issue: false hasContentIssue false
  • English
  • Français

Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films

Published online by Cambridge University Press:  05 August 2019

Ellis Kennedy ,
Alejandro Ceballos ,
Frances Hellman ,
Colin Ophus  and
Mary Scott
Ellis Kennedy*
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA.
Alejandro Ceballos
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA. Materials Sciences Division, Lawrence Berkeley National Lab, Berkeley, CA, USA.
Frances Hellman
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA. Department of Physics, University of California, Berkeley, Berkeley, CA, USA. Materials Sciences Division, Lawrence Berkeley National Lab, Berkeley, CA, USA.
Colin Ophus
Affiliation:
The Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, CA, USA.
Mary Scott
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA. The Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, CA, USA.
*
*Corresponding author: ellisrae@berkeley.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1886 - 1887
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yoshino, S et al. , Japanese Journal of Applied Physics 23(2R) (1984), p.188.Google Scholar
[2]Hellman, F and Gyorgy, EM, Physical Review Letters 68.9 (1992), p. 1391.Google Scholar
[3]Voyles, PM and Muller, DA, Ultramicroscopy 93(2) (2002), p.147.Google Scholar
[4]Ueno, T et al. , Journal of Physics D: Applied Physics 49(20) (2016), p.205001.Google Scholar
[5]This project is supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DE-AC02-05-CH11231 within the Non-equilibrium Magnetic Materials Program. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar