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Electronic Biasing of Monolayer Transition Metal Dichalcogenides in a TEM

Published online by Cambridge University Press:  05 August 2019

Akshay A. Murthy ,
Teodor K. Stanev ,
Roberto dos Reis ,
Nathaniel P. Stern  and
Vinayak P. Dravid
Akshay A. Murthy
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, USA. International Institute of Nanotechnology, Northwestern University, Evanston, USA.
Teodor K. Stanev
Affiliation:
Department of Physics and Astronomy, Northwestern University, Evanston, USA.
Roberto dos Reis
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, USA. NUANCE Center, Northwestern University, Evanston, USA.
Nathaniel P. Stern
Affiliation:
Department of Physics and Astronomy, Northwestern University, Evanston, USA.
Vinayak P. Dravid*
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, USA. International Institute of Nanotechnology, Northwestern University, Evanston, USA. NUANCE Center, Northwestern University, Evanston, USA.
*
*Corresponding author: v-dravid@northwestern.edu

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1904 - 1905
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Splendiani, A et al. , Nano Letters, 10 (2010). p. 1271-1275.Google Scholar
[2]Radisavljevic, B et al. , Nature Nanotechnology, 6 (2011). p. 147.Google Scholar
[3]Li, MY et al. , Science 349 (2015). p. 524-528.Google Scholar
[4]Li, Y et al. , ACS Nano, 11 (2017). p. 10321-10329.Google Scholar
[5]Lee, CH et al. , Nature Nanotechnology 9 (2014). p. 676.Google Scholar
[6]Murthy, A et al. , Nano Letters, 18 (2018), p. 2990-2998.Google Scholar
[7]This material is based upon work supported by the NSF (DMR-1507810) and made use of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720319) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation; and the State of Illinois, through the IIN. A.A.M. gratefully acknowledges support from the Ryan Fellowship and the IIN at Northwestern University.Google Scholar