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Atomic and Electronic Reconstruction at the a-LAO/STO Interface by E-Beam Induced Crystallization

Published online by Cambridge University Press:  05 August 2019

Gwangyeob Lee
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea. Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea.
Shin-ik Kim
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea.
Gyeongtak Han
Affiliation:
Department of Energy Science, Sungkyunkwan University, Suwon, South Korea.
Young-Min Kim
Affiliation:
Department of Energy Science, Sungkyunkwan University, Suwon, South Korea. IBS Center for Integrated Nanostructure Physics, Institute for Basic Science, Suwon, South Korea.
Seung-Hyub Baek
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea.
Do Hyang Kim
Affiliation:
Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea.
Hye Jung Chang*
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea. Division of Nano & Information Technology, KIST School, University of Science and Technology, Seoul, South Korea.
*
*Corresponding author: almacore@kist.re.kr
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Chakhalian, J, Millis, AJ and Rondinelli, J, Nature Materials 11(2) (2012), p. 92.CrossRefGoogle Scholar
[2]Hwang, HY et al. , Nature Materials 11 (2012), p. 103.CrossRefGoogle Scholar
[3]Yu, L and Zunger, A, Nature Communications 5 (2014), p. 5118.CrossRefGoogle Scholar
[4]Moon, SY et al. , Electronic Materials Letters 12(2) (2016), p. 243.CrossRefGoogle Scholar
[5]Li, CJ et al. , Scientific Reports 8 (2018), p. 404.CrossRefGoogle Scholar
[6]Lee, G et al. , RSC Advances 7(64) (2017), p. 40279.CrossRefGoogle Scholar
[7]Schneider, CW et al. , Appl. Phys. Lett. 89 (2006), p. 122101.CrossRefGoogle Scholar
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