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Atomic and Electronic Reconstruction at the a-LAO/STO Interface by E-Beam Induced Crystallization

Published online by Cambridge University Press:  05 August 2019

Gwangyeob Lee ,
Shin-ik Kim ,
Gyeongtak Han ,
Young-Min Kim ,
Seung-Hyub Baek ,
Do Hyang Kim  and
Hye Jung Chang
Gwangyeob Lee
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea. Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea.
Shin-ik Kim
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea.
Gyeongtak Han
Affiliation:
Department of Energy Science, Sungkyunkwan University, Suwon, South Korea.
Young-Min Kim
Affiliation:
Department of Energy Science, Sungkyunkwan University, Suwon, South Korea. IBS Center for Integrated Nanostructure Physics, Institute for Basic Science, Suwon, South Korea.
Seung-Hyub Baek
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea.
Do Hyang Kim
Affiliation:
Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea.
Hye Jung Chang*
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea. Division of Nano & Information Technology, KIST School, University of Science and Technology, Seoul, South Korea.
*
*Corresponding author: almacore@kist.re.kr

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1894 - 1895
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Chakhalian, J, Millis, AJ and Rondinelli, J, Nature Materials 11(2) (2012), p. 92.Google Scholar
[2]Hwang, HY et al. , Nature Materials 11 (2012), p. 103.Google Scholar
[3]Yu, L and Zunger, A, Nature Communications 5 (2014), p. 5118.Google Scholar
[4]Moon, SY et al. , Electronic Materials Letters 12(2) (2016), p. 243.Google Scholar
[5]Li, CJ et al. , Scientific Reports 8 (2018), p. 404.Google Scholar
[6]Lee, G et al. , RSC Advances 7(64) (2017), p. 40279.Google Scholar
[7]Schneider, CW et al. , Appl. Phys. Lett. 89 (2006), p. 122101.Google Scholar