Advances in Low Voltage Microscopy and Microanalysis
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Imaging at High Beam Energies in the Scanning Electron Microscope
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- 31 July 2006, pp. 1444-1445
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Secondary Electron Generation by Low Energy Ion Beams
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- 31 July 2006, pp. 1446-1447
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Realizing the Potential for Real Surface and Nanoparticle Analysis with an SEM
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- 31 July 2006, pp. 1448-1449
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Selfconsistent Electron Beam Charging of Non-Conductive Specimen in SEM and ESEM
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- 31 July 2006, pp. 1450-1451
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Where is SEM Resolution Reality in 2006: How do we Measure it and What are the Limits?
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- 31 July 2006, pp. 1452-1453
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Approaching the 1-Å barrier in the CTEM
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High Resolution Imaging Using the Oxford Aberration Corrected TEM.
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- 31 July 2006, pp. 1454-1455
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Contrast Transfer and Resolution Limits for Sub-Ångström High-Resolution Transmission Electron Microscopy
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- 31 July 2006, pp. 1456-1457
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Optimized Cs-corrected Imaging of Radiation-Sensitive High-Resolution Objects
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- 31 July 2006, pp. 1458-1459
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Validity of IWFR to Reconstruct an Exit Surface Wave
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- 31 July 2006, pp. 1460-1461
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Observing Charge Transfer and Charge Defects by HREM Imaging
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- 31 July 2006, pp. 1462-1463
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Aberration-free Imaging by Coherent Diffractive Imaging
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- 31 July 2006, pp. 1464-1465
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¡§A New Era of Imaging.¡¨ New Results Beyond the 1 Ångström Barrier
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- 31 July 2006, pp. 1466-1467
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Improvement Path for the Hexapole Cs-corrector Towards 0.5 A Resolution
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- 31 July 2006, pp. 1468-1469
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High Resolution TEM at 80kV Acceleration Voltage – Is Approaching 1 Ångström Possible?
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- 31 July 2006, pp. 1470-1471
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Accurate Objective Lens Defocus Calibration for Focal-Series Aberration-Corrected HRTEM at Sub-Ångström Resolution
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- 31 July 2006, pp. 1472-1473
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Aberration-Corrected HRTEM of Defects in Strained Lanthanum Cuprate Thin Films Grown on Strontium Titanate
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- 31 July 2006, pp. 1474-1475
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Direct Evidence of Oxygen Vacancies in the First Sillén-BiMEVOX Intergrowth
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- 31 July 2006, pp. 1476-1477
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Preliminary Results from a Sub-Angstrom TEM
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- 31 July 2006, pp. 1478-1479
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Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials
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Enhanced High Speed SE Imaging in a VPSEM Using a Frisch Grid
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 1480-1481
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Modeling Noise in Gas Cascade Secondary Electron Amplifiers
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 1482-1483
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