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Volume 12 - Issue S02 - August 2006

Contents

Page 37 of 45

Advances in Low Voltage Microscopy and Microanalysis

Abstract

  • Imaging at High Beam Energies in the Scanning Electron Microscope

  • L Gignac, S Boettcher, A Bol, O Wells, M Kawasaki
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1444-1445
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Secondary Electron Generation by Low Energy Ion Beams

  • D Joy, Y Lin, H Meyers, H Demers, D Newbury
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1446-1447
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Realizing the Potential for Real Surface and Nanoparticle Analysis with an SEM

  • ED Boyes
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1448-1449
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Selfconsistent Electron Beam Charging of Non-Conductive Specimen in SEM and ESEM

  • H-J Fitting, M Touzin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1450-1451
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Where is SEM Resolution Reality in 2006: How do we Measure it and What are the Limits?

  • BJ Griffin, JR Michael
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1452-1453
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Approaching the 1-Å barrier in the CTEM

Abstract

  • High Resolution Imaging Using the Oxford Aberration Corrected TEM.

  • C Hetherington, A Kirkland, R Doole, D Cockayne, J Titchmarsh, J Hutchison
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1454-1455
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Contrast Transfer and Resolution Limits for Sub-Ångström High-Resolution Transmission Electron Microscopy

  • M Lentzen, K Urban
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1456-1457
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Optimized Cs-corrected Imaging of Radiation-Sensitive High-Resolution Objects

  • M Malac, M Beleggia, R Egerton, Y Zhu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1458-1459
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Validity of IWFR to Reconstruct an Exit Surface Wave

  • K Ishizuka
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1460-1461
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Observing Charge Transfer and Charge Defects by HREM Imaging

  • B Deng, LD Marks
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1462-1463
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Aberration-free Imaging by Coherent Diffractive Imaging

  • J Wu, J Spence, U Weierstall
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1464-1465
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • ¡§A New Era of Imaging.¡¨ New Results Beyond the 1 Ångström Barrier

  • B Freitag, M Van der Stam, R Erni, S Lopatin, M Stekelenburg
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1466-1467
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Improvement Path for the Hexapole Cs-corrector Towards 0.5 A Resolution

  • M Haider, H Mueller, S Uhlemann
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1468-1469
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • High Resolution TEM at 80kV Acceleration Voltage – Is Approaching 1 Ångström Possible?

  • S Kujawa, R Erni, B Freitag, P Tiemeijer, M Stekelenburg
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1470-1471
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Accurate Objective Lens Defocus Calibration for Focal-Series Aberration-Corrected HRTEM at Sub-Ångström Resolution

  • MA O'Keefe, LF Allard, EC Nelson, DA Blom
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1472-1473
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Aberration-Corrected HRTEM of Defects in Strained Lanthanum Cuprate Thin Films Grown on Strontium Titanate

  • L Houben
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1474-1475
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Direct Evidence of Oxygen Vacancies in the First Sillén-BiMEVOX Intergrowth

  • D Ávila-Brande, ÁR Landa-Cánovas, LC Otero-Díaz
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1476-1477
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Preliminary Results from a Sub-Angstrom TEM

  • A Genc, J Ringnalda, DM Maher, HO Colijn, HL Fraser
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1478-1479
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials

Abstract

  • Enhanced High Speed SE Imaging in a VPSEM Using a Frisch Grid

  • MR Phillips, SW Morgan
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1480-1481
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Modeling Noise in Gas Cascade Secondary Electron Amplifiers

  • V Tileli, B Thiel
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1482-1483
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 37 of 45