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Volume 12 - Issue S02 - August 2006

Contents

Page 39 of 45

Cathodoluminescence in the Scanning Electron Microscope

Abstract

  • Optimal Conditions for Acquiring Cathodoluminescence (CL) Images Using a Cold-Field Emission Scanning Electron Microscope

  • JL Mey, AV Klaus
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1524-1525
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Comparison of Low Voltage Cathodoluminescent Phosphors

  • MR Phillips, D Drouin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1526-1527
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • The Photon Detector and the Variable-Pressure Scanning Electron Microscope An Alternative Method for Cathodoluminescence Imaging of Geologic Materials

  • T Williams, F Bailey
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1530-1531
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Cathodoluminescence of Ge- Clusters in Silica Layers

  • R Salh, L Fitting, H-J Fitting
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1532-1533
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Tomography in Biological and Materials Sciences

Abstract

  • Electron Cryotomography Reveals that the Caulobacter crescentus Cytoskeleton is Surprisingly Complex

  • DP Dias, A Briegel, RB Jensen, A Frangakis, GJ Jensen
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1536-1537
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • From Macromolecules to Cells: Progress and Challenges in Mesoscale Electron Tomography

  • BL Armbruster, M Kawasaki, J Brink, T Isabell, R O'Donnell, H Furukawa, M Shimizu, M Kersker
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1538-1539
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Parallel Beam Optical Tomography

  • L Yu, P-C Cheng
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1540-1541
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Determination of Resolution in Electron Tomography

  • PA Penczek, J Frank
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1542-1543
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Electron Tomographic Characterization of ErSi2 and GexSi1-x Nanoparticles Prepared by Doping of 4H-SiC

  • C Kuebel, U Kaiser
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1546-1547
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • High Resolution STEM Tomography of Nanomaterials

  • I Arslan, JR Tong, D Medlin, PA Midgley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1548-1549
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Three-Dimensional Nanoscale Chemical Imaging via EFTEM Spectral Imaging

  • IM Anderson, JH J Scott, ZH Levine
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1550-1551
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Application of Electron Tomography for Semiconductor Device Analysis

  • C Kuebel, T-C Lee, D Su, J-S Luo, H-M Lo, J Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1552-1553
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Three-dimensional Imaging of Nano-Voids in Copper Interconnects using Incoherent Bright Field (IBF) Tomography

  • PA Ercius, DA Muller, M Weyland, LM Gignac
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1554-1555
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Functionalized Holders for 3D S/TEM Imaging and Analysis of Nanoparticles

  • K Jarausch, D Leonard, T Kamino
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1556-1557
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Non-Destructive Isosurface 3-D Modeling by Scanning Electron Tomography

  • TS Yeoh, NA Ives
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1558-1559
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • High Resolution X-Ray UltraMicroscopy and Tomographic Reconstruction of Micro-Craters Preserved in Metallic Foils

  • J Sheffield-Parker, GG Graham, LA Brownlow, AT Kearsley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1560-1561
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • 3D Imaging with Single Atom Sensitivity using Confocal STEM

  • K van Benthem, N de Jonge, AY Borisevich, MP Oxley, SJ Pennycook
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1562-1563
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 39 of 45