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Volume 12 - Issue S02 - August 2006

Contents

Page 36 of 45

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping

Abstract

  • X-Ray Mapping and Post Processing

  • R Wuhrer, K Moran, MR Phillips
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1404-1405
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • X-Ray Mapping Using a Multiple-EDS (DUAL) Detectors

  • R Wuhrer, K Moran, MR Phillips, P Davey
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1406-1407
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Advanced High-Energy Resolution Silicon Drift Detectors

  • R Terborg, M Rohde
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1408-1409
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Spectrum Imaging Analysis of Secondary Phases in Aluminum Alloy 6063

  • S Claves, M Watanabe
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1410-1411
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • X-ray Mapping of Terrestrial and Extraterrestrial Materials Using the Electron Microprobe: A Progress Report

  • P Carpenter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1414-1415
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Performance of a 30 mm2 Silicon Drift Detector

  • D Rohde, D Stocker, M Misenheimer, J Howard
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1418-1419
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • The Application of Micro Area Analysis of Al-Cu Junction by Wavelength-Dispersive EPMA Equipped with a FE Electron Gun.

  • T Kimura, T Ogiwara, S Fukushima, S Tanuma
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1420-1421
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Automatic Phase Labeling During Spectral Imaging Acquisitions

  • P Camus, J McCarthy, D Rohde
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1422-1423
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Ultrafast Electron Microscopy

Abstract

  • Effect of Coulomb Interactions on Resolution in Ultrafast Electron Microscopy

  • HH Rose, R Spehr
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1424-1425
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Ultrafast Electron Microscopy: The Problem of Spatial Coherence

  • WA Schroeder
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1426-1427
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electronic Thermal Expansion and the Mechanism of Coherent Acoustic Phonons Generation in Metals

  • S Nie, H Park, X Wang, R Clinite, J Cao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1430-1431
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Single Shot Electron Diffraction Experiment Using a Sub ps MeV Electron Source

  • JF Schmerge, J Cardoza, J Castro, DH Dowell, SM Gierman, JB Hastings, H Loos, FM Rudakov, PM Weber
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1432-1433
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Advances in Low Voltage Microscopy and Microanalysis

Abstract

  • Low Voltage Electron Microscopy of Organic Materials

  • L Drummy, J Chen, J Yang, D Martin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1434-1435
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Low Voltage and Low Vacuum- When worlds Collide

  • B Thiel, V Tileli
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1436-1437
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Multi-Channel Detection of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope

  • I Mullerova, I Konvalina
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1438-1439
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Low Voltage Imaging of Carbon Nanotubes With Tin-Palladium Particles Using STEM Detector in a FE-SEM

  • C Probst, R Gauvin, RA L Drew
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1440-1441
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Variations in Peak Position and Energy Resolution for a Microcalorimeter EDS by Temporal X-ray Spectroscopy

  • H Demers, R Gauvin, DC Joy, EA Kenik
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1442-1443
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 36 of 45