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Volume 12 - Issue S02 - August 2006

Contents

Page 34 of 45

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Abstract

  • DualBeam Slice & View: Practical Aspects for Collecting 3D Cortex Image Data

  • JJ L Mulders, G Knott, BH Lich
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Annealing Induced Dissipation of Residual Trapped Charge in Focused Ion Beam Processed Wide Band Gap Materials for Device Applications.

  • MA Stevens-Kalceff, P Gowlett
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • A Wide Range of FIB Applications in a Multidisciplinary Analytical Facility

  • AD Batchelor, DP Griffis, PE Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1328-1329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Transfer of Sensitive Samples from FIB to TEM

  • PO Dickerson, RM Dickerson, TM Moore, G Amador, L Zaykova-Feldman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1330-1331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Morphological Evolution of Poly(tetrafuoroethylene) using Focused Ion Beam Irradiation

  • RL Schalek
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1332-1333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Advances in STEM Techniques for Materials Characterization

Abstract

  • A STEM Study of Glass

  • J Silcox, KA Mkhoyan
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1334-1335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • High Resolution EELS in the IBM Sub-Angstrom STEM

  • PE Batson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1336-1337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Three-dimensional Characterisation of Nanomaterials Using Aberration-Corrected STEM

  • PD Nellist, EC Cosgriff, V Nicolosi, JN Coleman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1338-1339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Ultimate Resolution Limit for Z–contrast STEM: Atoms are Smaller in ADF

  • Y Peng, M Oxley, A Lupini, M Chisholm, S Pennycook
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1340-1341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Advanced Tuning Algorithm for Crystalline Materials in Scanning Transmission Electron Microscopy

  • Q Ramasse, A Bleloch, R Klie, N Browning
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1342-1343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

  • D Williams, M Watanabe
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1344-1345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • In Situ Environmental STEM for Dynamic Nanochemical Analysis

  • PA Crozier
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1346-1347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Scanning Transmission Electron Tomography

  • P Midgley, M Gass, I Arslan, J Tong, T Yates, A Hungria, R Dunin-Borkowski, M Weyland, J Thomas
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1348-1349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Simulation of Coherent Scattering in the STEM

  • JS Wall
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1350-1351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Imaging Buried Monolayers at Atomic Resolution using Electron Channeling

  • L Fitting, M Jones, V Vaithyanathan, DG Schlom, DA Muller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1354-1355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Bright Enough to See Atoms?

  • A Bleloch, U Falke, U Bangert
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1356-1357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Atomic-Resolution Imaging in the Aberration-Corrected BNL JEM2200FS

  • RF Klie, Y Zhu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1358-1359
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Thickness Effects in High-angle Annular Dark-field Imaging of Interfaces

  • D Klenov, S Stemmer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1360-1361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Near-Simultaneous Core- and Low-Loss EELS Spectrum-Imaging in the STEM using a Fast Beam Switch.

  • P Thomas, J Scott, M MacKenzie, S McFadzean, J Wilbrink, A Craven
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1362-1363
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 34 of 45