No CrossRef data available.
Article contents
Annealing Induced Dissipation of Residual Trapped Charge in Focused Ion Beam Processed Wide Band Gap Materials for Device Applications.
Published online by Cambridge University Press: 31 July 2006
Extract
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
- Type
- Abstract
- Information
- Copyright
- © 2006 Microscopy Society of America