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Thickness Effects in High-angle Annular Dark-field Imaging of Interfaces

Published online by Cambridge University Press:  31 July 2006

D Klenov  and
S Stemmer
D Klenov
Affiliation:
University of California Santa Barbara
S Stemmer
Affiliation:
University of California Santa Barbara

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1360 - 1361
Copyright
© 2006 Microscopy Society of America